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X-RAY DIFFRACTION
Materials and Methods page
4FHB
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 293.15
    Details 0.2M sodium chloride, 0.1M Na HEPES, 25% w/v PEG 4000, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.89 α = 90
    b = 72.89 β = 90
    c = 254.27 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PILATUS 2M-F
    Collection Date 2012-03-28
     
    Diffraction Radiation
    Monochromator Bartels monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00004
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.8
    Resolution(Low) 44
    Number Reflections(All) 262820
    Number Reflections(Observed) 10672
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.95
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8
    Resolution(Low) 42.379
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 10599
    Number of Reflections(Observed) 10599
    Number of Reflections(R-Free) 506
    Percent Reflections(Observed) 99.97
    R-Factor(All) 0.2212
    R-Factor(Observed) 0.2212
    R-Work 0.2174
    R-Free 0.296
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.8152
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.8152
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.6304
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8001
    Shell Resolution(Low) 3.0818
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2422
    R-Factor(R-Work) 0.2465
    R-Factor(R-Free) 0.3357
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0818
    Shell Resolution(Low) 3.5276
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2461
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.3542
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5276
    Shell Resolution(Low) 4.4436
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2505
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2751
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.069
    f_dihedral_angle_d 16.458
    f_angle_d 1.174
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2190
    Nucleic Acid Atoms 0
    Heterogen Atoms 80
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SLS-X06DA specific
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection SLS-X06DA version: specific