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X-RAY DIFFRACTION
Materials and Methods page
4FGX
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 7.5
    Temperature 293.0
    Details 1.7 M Li2SO4/100 mM HEPES, pH 7.5, vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.71 α = 90
    b = 128.73 β = 90
    c = 76.16 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-05-12
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97915
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.5
    Resolution(Low) 43.14
    Number Reflections(Observed) 68706
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.064
    B(Isotropic) From Wilson Plot 22.288
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.59
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.582
    Mean I Over Sigma(Observed) 2.95
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.59
    Resolution(Low) 43.144
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 81377
    Number of Reflections(Observed) 68698
    Number of Reflections(R-Free) 2062
    Percent Reflections(Observed) 99.17
    R-Factor(Observed) 0.1678
    R-Work 0.1674
    R-Free 0.1813
    R-Free Selection Details 3%
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.2606
    Anisotropic B[1][1] -4.8439
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.9487
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.1047
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.59
    Shell Resolution(Low) 1.627
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4415
    R-Factor(R-Work) 0.2087
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.627
    Shell Resolution(Low) 1.6677
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4412
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2289
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6677
    Shell Resolution(Low) 1.7128
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4436
    R-Factor(R-Work) 0.1876
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7128
    Shell Resolution(Low) 1.7632
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4450
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7632
    Shell Resolution(Low) 1.8201
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4428
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.1945
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8201
    Shell Resolution(Low) 1.8851
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4447
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8851
    Shell Resolution(Low) 1.9606
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4424
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.1902
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9606
    Shell Resolution(Low) 2.0499
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4455
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2336
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0499
    Shell Resolution(Low) 2.1579
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4427
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.1762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1579
    Shell Resolution(Low) 2.2931
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4458
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2931
    Shell Resolution(Low) 2.4702
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4435
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.1811
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4702
    Shell Resolution(Low) 2.7187
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4470
    R-Factor(R-Work) 0.1758
    R-Factor(R-Free) 0.1881
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7187
    Shell Resolution(Low) 3.112
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4448
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.112
    Shell Resolution(Low) 3.9204
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4457
    R-Factor(R-Work) 0.1528
    R-Factor(R-Free) 0.1533
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9204
    Shell Resolution(Low) 43.1599
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4474
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.1581
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.226
    f_plane_restr 0.005
    f_chiral_restr 0.076
    f_angle_d 1.118
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2974
    Nucleic Acid Atoms 0
    Heterogen Atoms 26
    Solvent Atoms 462
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale