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X-RAY DIFFRACTION
Materials and Methods page
4FGH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 298.0
    Details 15-20% PEG 6000, 0.15M NaOAc, 0.1M MES pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.92 α = 90
    b = 78.92 β = 90
    c = 106.18 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type BRUKER SMART 6000
    Collection Date 2012-02-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type BRUKER AXS MICROSTAR
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.5
    Resolution(Low) 70
    Number Reflections(Observed) 7223
    Percent Possible(Observed) 100.0
    Redundancy 36.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method PDB entry 3M08
    reflnsShellList 2.5
    Resolution(Low) 68.348
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 7218
    Number of Reflections(R-Free) 723
    Percent Reflections(Observed) 99.94
    R-Factor(Observed) 0.1972
    R-Work 0.1916
    R-Free 0.2463
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.9774
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.9774
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.9548
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.6932
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1257
    R-Factor(R-Work) 0.2242
    R-Factor(R-Free) 0.3037
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6932
    Shell Resolution(Low) 2.9643
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1265
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9643
    Shell Resolution(Low) 3.3932
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1275
    R-Factor(R-Work) 0.1974
    R-Factor(R-Free) 0.2764
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3932
    Shell Resolution(Low) 4.275
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1299
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.275
    Shell Resolution(Low) 68.3731
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1399
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.2123
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.087
    f_dihedral_angle_d 23.655
    f_angle_d 1.184
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1316
    Nucleic Acid Atoms 0
    Heterogen Atoms 93
    Solvent Atoms 69
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)