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X-RAY DIFFRACTION
Materials and Methods page
4FG7
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 6
    Temperature 277.0
    Details 200mM NH4Ac, 100mM (CH3)2AsO2Na, 25% PEG 8000, pH 6.0, vapor diffusion, hanging drop, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.68 α = 90
    b = 65.68 β = 90
    c = 139.89 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
    Collection Date 2007-03-04
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-6A
    Wavelength List 1.0000
    Site PHOTON FACTORY
    Beamline BL-6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.7
    Resolution(Low) 59.46
    Number Reflections(All) 8967
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.052
    B(Isotropic) From Wilson Plot 68.7
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.8
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.425
    Mean I Over Sigma(Observed) 4.9
    Redundancy 6.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7
    Resolution(Low) 59.46
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 8967
    Number of Reflections(Observed) 8918
    Number of Reflections(R-Free) 461
    Percent Reflections(Observed) 99.25
    R-Factor(Observed) 0.2214
    R-Work 0.2201
    R-Free 0.2458
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 51.0192
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.699
    Shell Resolution(Low) 2.769
    Number of Reflections(R-Free) 27
    Number of Reflections(R-Work) 609
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.467
    Percent Reflections(Observed) 97.7
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    RIGID-BOND RESTRAINTS (A''2) 1.682
    r_bond_refined_d 0.017
    r_angle_refined_deg 1.435
    r_dihedral_angle_1_deg 5.119
    r_dihedral_angle_2_deg 38.569
    r_dihedral_angle_3_deg 15.95
    r_dihedral_angle_4_deg 18.64
    CHIRAL-CENTER RESTRAINTS (A''3) 0.093
    r_gen_planes_refined 0.006
    MAIN-CHAIN BOND REFINED ATOMS (A''2) 1.23
    MAIN-CHAIN ANGLE REFINED ATOMS (A''2) 2.193
    SIDE-CHAIN BOND REFINED ATOMS (A''2) 2.995
    SIDE-CHAIN ANGLE REFINED ATOMS (A''2) 4.594
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2008
    Nucleic Acid Atoms 0
    Heterogen Atoms 31
    Solvent Atoms 79
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement REFMAC 5.5.0109
     
    Software
    data extraction pdb_extract version: 3.11
    refinement REFMAC5 version: 5.5.0109