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X-RAY DIFFRACTION
Materials and Methods page
4FF4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 295.0
    Details 0.1 M TRIS-HCL, 0.21 M DIBASIC AMMONIUM CITRATE, 0.09 M AMMONIUM DIHYDROGEN MONOPHOSPHATE, 25 % (DROP) 15% (RESERVOIR) PEG 3350 , pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.4 α = 90
    b = 111.78 β = 90
    c = 276.89 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-07-07
     
    Diffraction Radiation
    Monochromator mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.03
    Resolution(Low) 43.9
    Number Reflections(Observed) 156753
    Percent Possible(Observed) 95.1
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.026
    Resolution(Low) 43.87
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 156753
    Number of Reflections(R-Free) 1999
    Percent Reflections(Observed) 94.09
    R-Factor(Observed) 0.1915
    R-Work 0.1909
    R-Free 0.2387
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.1525
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.3644
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.2119
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0258
    Shell Resolution(Low) 2.0764
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 8287
    R-Factor(R-Work) 0.3179
    R-Factor(R-Free) 0.3787
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0764
    Shell Resolution(Low) 2.1326
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 10325
    R-Factor(R-Work) 0.2942
    R-Factor(R-Free) 0.3175
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1326
    Shell Resolution(Low) 2.1953
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 10595
    R-Factor(R-Work) 0.2709
    R-Factor(R-Free) 0.3362
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1953
    Shell Resolution(Low) 2.2662
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 10692
    R-Factor(R-Work) 0.2555
    R-Factor(R-Free) 0.3201
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2662
    Shell Resolution(Low) 2.3472
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 10901
    R-Factor(R-Work) 0.2409
    R-Factor(R-Free) 0.2853
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3472
    Shell Resolution(Low) 2.4412
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 11082
    R-Factor(R-Work) 0.2268
    R-Factor(R-Free) 0.2891
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4412
    Shell Resolution(Low) 2.5522
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 11155
    R-Factor(R-Work) 0.2224
    R-Factor(R-Free) 0.2605
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5522
    Shell Resolution(Low) 2.6868
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 11335
    R-Factor(R-Work) 0.2162
    R-Factor(R-Free) 0.2809
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6868
    Shell Resolution(Low) 2.8551
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 11445
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2637
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8551
    Shell Resolution(Low) 3.0755
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 11466
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2297
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0755
    Shell Resolution(Low) 3.3849
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 11643
    R-Factor(R-Work) 0.1903
    R-Factor(R-Free) 0.2472
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3849
    Shell Resolution(Low) 3.8744
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 11766
    R-Factor(R-Work) 0.1642
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8744
    Shell Resolution(Low) 4.8803
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 11852
    R-Factor(R-Work) 0.133
    R-Factor(R-Free) 0.183
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8803
    Shell Resolution(Low) 43.8801
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 12210
    R-Factor(R-Work) 0.1617
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.061
    f_dihedral_angle_d 15.697
    f_angle_d 0.929
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16908
    Nucleic Acid Atoms 826
    Heterogen Atoms 66
    Solvent Atoms 1198
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Phaser
    data collection HKL-2000