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X-RAY DIFFRACTION
Materials and Methods page
4FF3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 295.0
    Details 0.1 M TRIS-HCL, 0.21 M DIBASIC AMMONIUM CITRATE, 0.09 M AMMONIUM DIHYDROGEN MONOPHOSPHATE, 25 % (DROP) 15% (RESERVOIR) PEG 3350 , pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.02 α = 90
    b = 111.65 β = 90
    c = 276.14 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-07-07
     
    Diffraction Radiation
    Monochromator mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 42.38
    Percent Possible(Observed) 89.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.997
    Resolution(Low) 42.382
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 582255
    Number of Reflections(Observed) 153225
    Number of Reflections(R-Free) 1999
    Percent Reflections(Observed) 88.89
    R-Factor(Observed) 0.1825
    R-Work 0.1821
    R-Free 0.2112
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.0207
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.6623
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.6416
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9968
    Shell Resolution(Low) 2.0468
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 9330
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.3011
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0468
    Shell Resolution(Low) 2.1021
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 9489
    R-Factor(R-Work) 0.2097
    R-Factor(R-Free) 0.2583
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1021
    Shell Resolution(Low) 2.164
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 9512
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.164
    Shell Resolution(Low) 2.2338
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 9661
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2242
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2338
    Shell Resolution(Low) 2.3136
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 9929
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2695
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3136
    Shell Resolution(Low) 2.4063
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 10339
    R-Factor(R-Work) 0.2034
    R-Factor(R-Free) 0.2673
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4063
    Shell Resolution(Low) 2.5158
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 10650
    R-Factor(R-Work) 0.2007
    R-Factor(R-Free) 0.2684
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5158
    Shell Resolution(Low) 2.6484
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 11015
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6484
    Shell Resolution(Low) 2.8143
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 11251
    R-Factor(R-Work) 0.2047
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8143
    Shell Resolution(Low) 3.0315
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 11551
    R-Factor(R-Work) 0.2113
    R-Factor(R-Free) 0.2183
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0315
    Shell Resolution(Low) 3.3365
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 11764
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2312
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3365
    Shell Resolution(Low) 3.819
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 12117
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.208
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.819
    Shell Resolution(Low) 4.8105
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 12219
    R-Factor(R-Work) 0.1398
    R-Factor(R-Free) 0.164
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8105
    Shell Resolution(Low) 42.3918
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 12399
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.1531
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.057
    f_dihedral_angle_d 15.215
    f_angle_d 0.863
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16908
    Nucleic Acid Atoms 826
    Heterogen Atoms 67
    Solvent Atoms 1245
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Phaser
    data collection HKL-2000