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X-RAY DIFFRACTION
Materials and Methods page
4FF2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 295.0
    Details 0.1 M TRIS-HCL, 0.21 M DIBASIC AMMONIUM CITRATE, 0.09 M AMMONIUM DIHYDROGEN MONOPHOSPHATE, 25 % (DROP) 15% (RESERVOIR) PEG 3350, pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.91 α = 90
    b = 111.44 β = 90
    c = 275.76 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-07-07
     
    Diffraction Radiation
    Monochromator Mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 47.67
    Percent Possible(Observed) 90.3
    Redundancy 4.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 47.674
    Cut-off Sigma(F) 1.37
    Number of Reflections(Observed) 154842
    Number of Reflections(R-Free) 1978
    Percent Reflections(Observed) 90.68
    R-Factor(Observed) 0.2082
    R-Work 0.2076
    R-Free 0.2554
    R-Free Selection Details Randam
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.918
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.9735
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0555
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.05
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 9144
    R-Factor(R-Work) 0.336
    R-Factor(R-Free) 0.3621
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.05
    Shell Resolution(Low) 2.1054
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 9469
    R-Factor(R-Work) 0.3187
    R-Factor(R-Free) 0.3656
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1054
    Shell Resolution(Low) 2.1674
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 9699
    R-Factor(R-Work) 0.2951
    R-Factor(R-Free) 0.3251
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1674
    Shell Resolution(Low) 2.2374
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 9985
    R-Factor(R-Work) 0.2737
    R-Factor(R-Free) 0.32
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2374
    Shell Resolution(Low) 2.3173
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 10199
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3181
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3173
    Shell Resolution(Low) 2.4101
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 10716
    R-Factor(R-Work) 0.2608
    R-Factor(R-Free) 0.3008
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4101
    Shell Resolution(Low) 2.5198
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 10913
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.3173
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5198
    Shell Resolution(Low) 2.6526
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 11247
    R-Factor(R-Work) 0.2404
    R-Factor(R-Free) 0.2661
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6526
    Shell Resolution(Low) 2.8188
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 11406
    R-Factor(R-Work) 0.2258
    R-Factor(R-Free) 0.2595
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8188
    Shell Resolution(Low) 3.0364
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 11584
    R-Factor(R-Work) 0.2273
    R-Factor(R-Free) 0.2825
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0364
    Shell Resolution(Low) 3.3419
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 11720
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3419
    Shell Resolution(Low) 3.8253
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 12043
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.2286
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8253
    Shell Resolution(Low) 4.8187
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 12191
    R-Factor(R-Work) 0.14
    R-Factor(R-Free) 0.1922
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8187
    Shell Resolution(Low) 47.6873
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 12548
    R-Factor(R-Work) 0.1536
    R-Factor(R-Free) 0.1812
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.054
    f_dihedral_angle_d 15.61
    f_angle_d 0.831
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16908
    Nucleic Acid Atoms 826
    Heterogen Atoms 66
    Solvent Atoms 1173
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Phaser
    data collection HKL-2000