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X-RAY DIFFRACTION
Materials and Methods page
4FF1
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 295.0
    Details 0.1 M TRIS-HCL, 0.21 M DIBASIC AMMONIUM CITRATE, 0.09 M AMMONIUM DIHYDROGEN MONOPHOSPHATE, 25 % (DROP) 15% (RESERVOIR) PEG 3350, pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.16 α = 90
    b = 111.5 β = 90
    c = 277.1 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-07-07
     
    Diffraction Radiation
    Monochromator Mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.47
    Resolution(Low) 50
    Percent Possible(Observed) 95.4
    Redundancy 5.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.47
    Resolution(Low) 47.84
    Cut-off Sigma(F) 1.39
    Number of Reflections(Observed) 88717
    Number of Reflections(R-Free) 4416
    Percent Reflections(Observed) 95.18
    R-Factor(Observed) 0.1563
    R-Work 0.1534
    R-Free 0.2111
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4609
    Shell Resolution(Low) 2.4889
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2698
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4889
    Shell Resolution(Low) 2.5182
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.2112
    R-Factor(R-Free) 0.3112
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5182
    Shell Resolution(Low) 2.5489
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.3175
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5489
    Shell Resolution(Low) 2.5811
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2748
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5811
    Shell Resolution(Low) 2.6151
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2788
    R-Factor(R-Work) 0.1983
    R-Factor(R-Free) 0.276
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6151
    Shell Resolution(Low) 2.6509
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2861
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6509
    Shell Resolution(Low) 2.6888
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.3119
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6888
    Shell Resolution(Low) 2.7289
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2823
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7289
    Shell Resolution(Low) 2.7716
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2758
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.259
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7716
    Shell Resolution(Low) 2.817
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2777
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.2671
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.817
    Shell Resolution(Low) 2.8656
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.1759
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8656
    Shell Resolution(Low) 2.9177
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2644
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9177
    Shell Resolution(Low) 2.9738
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2752
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.2589
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9738
    Shell Resolution(Low) 3.0345
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2775
    R-Factor(R-Work) 0.1827
    R-Factor(R-Free) 0.2563
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0345
    Shell Resolution(Low) 3.1004
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2452
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1004
    Shell Resolution(Low) 3.1725
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2332
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1725
    Shell Resolution(Low) 3.2519
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2798
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2519
    Shell Resolution(Low) 3.3398
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2045
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3398
    Shell Resolution(Low) 3.438
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.438
    Shell Resolution(Low) 3.549
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2815
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.549
    Shell Resolution(Low) 3.6758
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2787
    R-Factor(R-Work) 0.1529
    R-Factor(R-Free) 0.2376
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6758
    Shell Resolution(Low) 3.8229
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2842
    R-Factor(R-Work) 0.1414
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8229
    Shell Resolution(Low) 3.9968
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2846
    R-Factor(R-Work) 0.1328
    R-Factor(R-Free) 0.1804
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9968
    Shell Resolution(Low) 4.2074
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2863
    R-Factor(R-Work) 0.1222
    R-Factor(R-Free) 0.1819
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2074
    Shell Resolution(Low) 4.4708
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2894
    R-Factor(R-Work) 0.1145
    R-Factor(R-Free) 0.1464
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4708
    Shell Resolution(Low) 4.8157
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1121
    R-Factor(R-Free) 0.1485
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8157
    Shell Resolution(Low) 5.2998
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2919
    R-Factor(R-Work) 0.1197
    R-Factor(R-Free) 0.1723
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2998
    Shell Resolution(Low) 6.0653
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2932
    R-Factor(R-Work) 0.1389
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0653
    Shell Resolution(Low) 7.6367
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2949
    R-Factor(R-Work) 0.136
    R-Factor(R-Free) 0.1787
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.6367
    Shell Resolution(Low) 47.8489
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3053
    R-Factor(R-Work) 0.1324
    R-Factor(R-Free) 0.1447
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 16.42
    f_angle_d 1.075
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16908
    Nucleic Acid Atoms 826
    Heterogen Atoms 10
    Solvent Atoms 656
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: dev_1042)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1042)
    model building Phaser
    data collection HKL-2000