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X-RAY DIFFRACTION
Materials and Methods page
4FCZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Details Protein solution: 100mM NaCl, 5mM DTT, 0.02% NaN3, 10mM Tris-HCl, pH 7.5, VAPOR DIFFUSION, HANGING DROP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.87 α = 90
    b = 40.88 β = 106.49
    c = 82.4 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Details mirrors
    Collection Date 2011-04-14
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4C
    Wavelength List 0.979
    Site NSLS
    Beamline X4C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 39.09
    Number Reflections(Observed) 28693
    Percent Possible(Observed) 94.7
    R Merge I(Observed) 0.112
    Redundancy 5.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.604
    Resolution(Low) 39.086
    Cut-off Sigma(F) 0.13
    Number of Reflections(Observed) 14803
    Number of Reflections(R-Free) 1574
    Percent Reflections(Observed) 92.3
    R-Factor(Observed) 0.2367
    R-Work 0.2326
    R-Free 0.2976
     
    Temperature Factor Modeling
    Mean Isotropic B Value 43.825
    Anisotropic B[1][1] -7.206
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -6.274
    Anisotropic B[2][2] 1.742
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.464
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6067
    Shell Resolution(Low) 2.6908
    Number of Reflections(R-Free) 92
    Number of Reflections(R-Work) 817
    R-Factor(R-Work) 0.2827
    R-Factor(R-Free) 0.3678
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6908
    Shell Resolution(Low) 2.7869
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1034
    R-Factor(R-Work) 0.2723
    R-Factor(R-Free) 0.3707
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7869
    Shell Resolution(Low) 2.8984
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1184
    R-Factor(R-Work) 0.2611
    R-Factor(R-Free) 0.3219
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8984
    Shell Resolution(Low) 3.0303
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1200
    R-Factor(R-Work) 0.2645
    R-Factor(R-Free) 0.3526
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0303
    Shell Resolution(Low) 3.1899
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1249
    R-Factor(R-Work) 0.2569
    R-Factor(R-Free) 0.2924
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1899
    Shell Resolution(Low) 3.3896
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1280
    R-Factor(R-Work) 0.2377
    R-Factor(R-Free) 0.3164
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3896
    Shell Resolution(Low) 3.6511
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1262
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.3015
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6511
    Shell Resolution(Low) 4.018
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1293
    R-Factor(R-Work) 0.2112
    R-Factor(R-Free) 0.281
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.018
    Shell Resolution(Low) 4.5983
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1305
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.2267
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5983
    Shell Resolution(Low) 5.789
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1311
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.287
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.789
    Shell Resolution(Low) 34.6058
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1359
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.3069
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.076
    f_dihedral_angle_d 16.232
    f_angle_d 1.189
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2862
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 41
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution Phenix (AutoSolve)
    Structure Refinement PHENIX (phenix.refine: dev_1269)
     
    Software
    data extraction pdb_extract version: 3.100
    refinement phenix