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X-RAY DIFFRACTION
Materials and Methods page
4FBU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 298.0
    Details 0.2 M Ca(Ac)2, 0.1 M Hepes 7.0, 15 % PEG 3350, 2.5 % glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 52.77 α = 90
    b = 181.46 β = 109.49
    c = 52.74 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-08-30
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.97918
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.6
    Resolution(Low) 31.24
    Number Reflections(All) 29148
    Number Reflections(Observed) 25790
    Percent Possible(Observed) 95.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 31.24
    Cut-off Sigma(F) 0.02
    Number of Reflections(all) 29148
    Number of Reflections(Observed) 25790
    Number of Reflections(R-Free) 1324
    Percent Reflections(Observed) 89.95
    R-Factor(Observed) 0.2198
    R-Work 0.2175
    R-Free 0.2614
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.854
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 2.3644
    Anisotropic B[2][2] 10.0547
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.2007
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.7041
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.3278
    R-Factor(R-Free) 0.3195
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7041
    Shell Resolution(Low) 2.8271
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.3077
    R-Factor(R-Free) 0.3739
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8271
    Shell Resolution(Low) 2.976
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2749
    R-Factor(R-Work) 0.2995
    R-Factor(R-Free) 0.3733
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.976
    Shell Resolution(Low) 3.1623
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2777
    R-Factor(R-Work) 0.2461
    R-Factor(R-Free) 0.3044
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1623
    Shell Resolution(Low) 3.4062
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.2191
    R-Factor(R-Free) 0.2706
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4062
    Shell Resolution(Low) 3.7485
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.2166
    R-Factor(R-Free) 0.2513
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7485
    Shell Resolution(Low) 4.2897
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2844
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2459
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2897
    Shell Resolution(Low) 5.4
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2748
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.1901
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4
    Shell Resolution(Low) 31.2418
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2397
    R-Factor(R-Work) 0.2158
    R-Factor(R-Free) 0.2607
    Percent Reflections(Observed) 78.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 20.046
    f_angle_d 1.222
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5467
    Nucleic Acid Atoms 1136
    Heterogen Atoms 4
    Solvent Atoms 248
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)