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X-RAY DIFFRACTION
Materials and Methods page
4FB3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.1
    Temperature 277.0
    Details 14% PEG 3350, 140 mM sodium citrate, pH 7.1, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 165.15 α = 90
    b = 167.92 β = 90
    c = 77.73 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-09-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.79
    Resolution(Low) 117.46
    Number Reflections(All) 11102
    Number Reflections(Observed) 11084
    Percent Possible(Observed) 99.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.79
    Resolution(Low) 46.931
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 11080
    Number of Reflections(R-Free) 529
    Percent Reflections(Observed) 99.89
    R-Factor(Observed) 0.2229
    R-Work 0.2218
    R-Free 0.2444
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 23.8896
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -7.1107
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -16.7789
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.79
    Shell Resolution(Low) 4.1712
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.281
    R-Factor(R-Free) 0.3136
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1712
    Shell Resolution(Low) 4.7743
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2081
    R-Factor(R-Free) 0.2232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7743
    Shell Resolution(Low) 6.0131
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2365
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0131
    Shell Resolution(Low) 46.9344
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.22
    R-Factor(R-Free) 0.2357
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.061
    f_dihedral_angle_d 21.759
    f_angle_d 1.035
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2727
    Nucleic Acid Atoms 1060
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)