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X-RAY DIFFRACTION
Materials and Methods page
4FAM
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 289.0
    Details 0.2 M potassium thiocyanate, 20 % (w/v) PEG3350, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.72 α = 90
    b = 106.76 β = 103.11
    c = 74.88 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944+
    Details Varimax HF Optics
    Collection Date 2010-04-19
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54182
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2
    Resolution(Low) 20.03
    Number Reflections(All) 49665
    Number Reflections(Observed) 49665
    Percent Possible(Observed) 98.7
    Redundancy 2.8
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 92.8
    Redundancy 1.9
    Number Unique Reflections(All) 4646
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 20.03
    Number of Reflections(all) 47140
    Number of Reflections(Observed) 47140
    Number of Reflections(R-Free) 2524
    Percent Reflections(Observed) 98.61
    R-Factor(Observed) 0.17015
    R-Work 0.16761
    R-Free 0.21803
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.518
    Anisotropic B[1][1] -0.6
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.12
    Anisotropic B[2][2] 1.32
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.67
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.052
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3194
    R-Factor(R-Work) 0.251
    R-Factor(R-Free) 0.294
    Percent Reflections(Observed) 91.71
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.01
    r_chiral_restr 0.271
    r_dihedral_angle_4_deg 14.812
    r_dihedral_angle_3_deg 13.475
    r_dihedral_angle_2_deg 37.716
    r_dihedral_angle_1_deg 6.573
    r_angle_other_deg 1.048
    r_angle_refined_deg 2.03
    r_bond_other_d 0.001
    r_bond_refined_d 0.02
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4972
    Nucleic Acid Atoms 0
    Heterogen Atoms 176
    Solvent Atoms 571
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) StructureStudio
    Data Reduction (data scaling) StructureStudio
    Structure Solution PHASER
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building PHASER
    data collection StructureStudio