X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 289.0
Details 25 % (w/v) PEG1500, 0.1M PCTP buffer, pH 8, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 58.69 α = 90
b = 64.7 β = 90
c = 96.65 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944+ Varimax HF Optics 2010-04-20
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.54182 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 18.65 97.9 -- -- -- 3.5 24949 24949 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.07 95.2 -- -- -- 2.3 2378

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 18.65 -- -- 23672 23672 1275 97.7 -- 0.18361 0.18155 0.22129 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.052 -- 80 1654 0.264 0.326 -- 94.91
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 22.853
Anisotropic B[1][1] 1.04
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.1
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.94
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 4.034
r_scbond_it 2.783
r_mcangle_it 1.811
r_mcbond_other 0.305
r_mcbond_it 1.06
r_gen_planes_other 0.001
r_gen_planes_refined 0.009
r_chiral_restr 0.135
r_dihedral_angle_4_deg 13.667
r_dihedral_angle_3_deg 13.668
r_dihedral_angle_2_deg 35.656
r_dihedral_angle_1_deg 6.414
r_angle_other_deg 1.035
r_angle_refined_deg 1.915
r_bond_other_d 0.001
r_bond_refined_d 0.023
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2438
Nucleic Acid Atoms 0
Heterogen Atoms 83
Solvent Atoms 161

Software

Computing
Computing Package Purpose
StructureStudio Data Collection
StructureStudio Data Reduction (intensity integration)
StructureStudio Data Reduction (data scaling)
PHASER Structure Solution
REFMAC 5.5.0072 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0072 refinement
PHASER model building
StructureStudio data collection