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X-RAY DIFFRACTION
Materials and Methods page
4F8L
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.2
    Temperature 298.0
    Details 1.5 M ammonium sulphate, 0.17 M Guanidine HCl, pH 4.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 26.11 α = 90
    b = 54.16 β = 90
    c = 101.63 γ = 90
     
    Space Group
    Space Group Name:    P 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-11-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 0.9
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.5
    Resolution(Low) 50
    Percent Possible(Observed) 96.8
    R Merge I(Observed) 0.109
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.55
    Percent Possible(All) 90.7
    R Merge I(Observed) 0.538
    Redundancy 4.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SIRAS
    reflnsShellList 1.5
    Resolution(Low) 27.08
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 23029
    Number of Reflections(R-Free) 1178
    Percent Reflections(Observed) 95.9
    R-Factor(Observed) 0.141
    R-Work 0.139
    R-Free 0.182
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.07
    Anisotropic B[1][1] -1.6641
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.5375
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.8734
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.5668
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2247
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2825
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5668
    Shell Resolution(Low) 1.6494
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2182
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6494
    Shell Resolution(Low) 1.7528
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.1522
    R-Factor(R-Free) 0.2065
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7528
    Shell Resolution(Low) 1.8881
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.2002
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8881
    Shell Resolution(Low) 2.078
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.1091
    R-Factor(R-Free) 0.1509
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.078
    Shell Resolution(Low) 2.3786
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.1156
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3786
    Shell Resolution(Low) 2.9961
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2878
    R-Factor(R-Work) 0.1325
    R-Factor(R-Free) 0.1686
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9961
    Shell Resolution(Low) 27.0864
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3027
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.1836
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.317
    f_dihedral_angle_d 13.775
    f_angle_d 1.393
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1073
    Nucleic Acid Atoms 0
    Heterogen Atoms 76
    Solvent Atoms 146
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.2_869)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    density modification DM
    phasing SOLVE
    data reduction SCALEPACK