POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4F7U
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 15% Jeffamine ED-2003 titrated to pH 7, 10% ethanol, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 180.72 α = 90
    b = 65.3 β = 92.47
    c = 99.35 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-10-20
     
    Diffraction Radiation
    Monochromator XXX
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength List 0.9393
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 49.6
    Number Reflections(All) 91669
    Number Reflections(Observed) 88058
    Percent Possible(Observed) 96.2
    Redundancy 2.69
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.01
    Percent Possible(All) 96.2
    R-Sym I(Observed) 0.582
    Redundancy 2.71
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.898
    Resolution(Low) 49.627
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 88054
    Number of Reflections(R-Free) 4426
    Percent Reflections(Observed) 96.06
    R-Factor(Observed) 0.1827
    R-Work 0.1807
    R-Free 0.2213
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.4478
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.0352
    Anisotropic B[2][2] 8.7345
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.2867
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8982
    Shell Resolution(Low) 1.9198
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2518
    R-Factor(R-Work) 0.3128
    R-Factor(R-Free) 0.3502
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9198
    Shell Resolution(Low) 1.9424
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.2978
    R-Factor(R-Free) 0.3669
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9424
    Shell Resolution(Low) 1.9661
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2777
    R-Factor(R-Work) 0.2638
    R-Factor(R-Free) 0.32
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9661
    Shell Resolution(Low) 1.991
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2782
    R-Factor(R-Work) 0.2431
    R-Factor(R-Free) 0.2719
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.991
    Shell Resolution(Low) 2.0172
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.2281
    R-Factor(R-Free) 0.2544
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0172
    Shell Resolution(Low) 2.0448
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2830
    R-Factor(R-Work) 0.2239
    R-Factor(R-Free) 0.2684
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0448
    Shell Resolution(Low) 2.074
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.2199
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.074
    Shell Resolution(Low) 2.105
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.2682
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.105
    Shell Resolution(Low) 2.1379
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1379
    Shell Resolution(Low) 2.1729
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1729
    Shell Resolution(Low) 2.2104
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2768
    R-Factor(R-Work) 0.1913
    R-Factor(R-Free) 0.2247
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2104
    Shell Resolution(Low) 2.2506
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2823
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2771
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2506
    Shell Resolution(Low) 2.2939
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.191
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2939
    Shell Resolution(Low) 2.3407
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2837
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2757
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3407
    Shell Resolution(Low) 2.3916
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.194
    R-Factor(R-Free) 0.2761
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3916
    Shell Resolution(Low) 2.4472
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2823
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2236
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4472
    Shell Resolution(Low) 2.5084
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2681
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5084
    Shell Resolution(Low) 2.5762
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2775
    R-Factor(R-Work) 0.1942
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5762
    Shell Resolution(Low) 2.652
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2831
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2685
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.652
    Shell Resolution(Low) 2.7376
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2801
    R-Factor(R-Work) 0.1879
    R-Factor(R-Free) 0.2564
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7376
    Shell Resolution(Low) 2.8355
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2841
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8355
    Shell Resolution(Low) 2.949
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2586
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.949
    Shell Resolution(Low) 3.0832
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2853
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2186
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0832
    Shell Resolution(Low) 3.2457
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2815
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2457
    Shell Resolution(Low) 3.449
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2798
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2089
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.449
    Shell Resolution(Low) 3.7152
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2819
    R-Factor(R-Work) 0.1651
    R-Factor(R-Free) 0.1818
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7152
    Shell Resolution(Low) 4.0889
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2801
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.1859
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0889
    Shell Resolution(Low) 4.6802
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2811
    R-Factor(R-Work) 0.1235
    R-Factor(R-Free) 0.1504
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6802
    Shell Resolution(Low) 5.8951
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2889
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.1796
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8951
    Shell Resolution(Low) 49.6438
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.114
    f_dihedral_angle_d 14.62
    f_angle_d 1.583
    f_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7985
    Nucleic Acid Atoms 0
    Heterogen Atoms 13
    Solvent Atoms 372
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MXCUBE
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection MXCUBE