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X-RAY DIFFRACTION
Materials and Methods page
4F7T
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.5
    Temperature 293.0
    Details 0.1 M Bis-Tris and 10% (w/v) polyethylene glycol 3,350, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 52.84 α = 97.7
    b = 66.58 β = 101.03
    c = 70.36 γ = 111.84
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS VII
    Collection Date 2010-11-13
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.7
    Resolution(Low) 50
    Number Reflections(Observed) 90267
    Percent Possible(Observed) 96.1
    R Merge I(Observed) 0.045
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.76
    Percent Possible(All) 93.8
    R Merge I(Observed) 0.289
    Mean I Over Sigma(Observed) 4.264
    R-Sym I(Observed) 0.289
    Redundancy 3.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 24.42
    Cut-off Sigma(F) 0.09
    Number of Reflections(Observed) 86431
    Number of Reflections(R-Free) 4329
    Percent Reflections(Observed) 91.9
    R-Factor(Observed) 0.197
    R-Work 0.196
    R-Free 0.227
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 7.7703
    Anisotropic B[1][2] 7.8818
    Anisotropic B[1][3] -0.2931
    Anisotropic B[2][2] -2.7935
    Anisotropic B[2][3] -2.0969
    Anisotropic B[3][3] -4.9768
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6973
    Shell Resolution(Low) 1.7166
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2275
    R-Factor(R-Work) 0.2464
    R-Factor(R-Free) 0.2782
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7166
    Shell Resolution(Low) 1.7368
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2392
    R-Factor(R-Work) 0.235
    R-Factor(R-Free) 0.3152
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7368
    Shell Resolution(Low) 1.758
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2535
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.2544
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.758
    Shell Resolution(Low) 1.7802
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2493
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.2605
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7802
    Shell Resolution(Low) 1.8036
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.2173
    R-Factor(R-Free) 0.2731
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8036
    Shell Resolution(Low) 1.8283
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.2273
    R-Factor(R-Free) 0.2894
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8283
    Shell Resolution(Low) 1.8544
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2173
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8544
    Shell Resolution(Low) 1.8821
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.2262
    R-Factor(R-Free) 0.2806
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8821
    Shell Resolution(Low) 1.9115
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2133
    R-Factor(R-Free) 0.2341
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9115
    Shell Resolution(Low) 1.9428
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.2105
    R-Factor(R-Free) 0.2534
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9428
    Shell Resolution(Low) 1.9763
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.2098
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9763
    Shell Resolution(Low) 2.0122
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2673
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0122
    Shell Resolution(Low) 2.0509
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0509
    Shell Resolution(Low) 2.0928
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0928
    Shell Resolution(Low) 2.1382
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2829
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1382
    Shell Resolution(Low) 2.1879
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1879
    Shell Resolution(Low) 2.2426
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2816
    R-Factor(R-Work) 0.1983
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2426
    Shell Resolution(Low) 2.3032
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 2883
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2382
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3032
    Shell Resolution(Low) 2.3709
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2836
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2192
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3709
    Shell Resolution(Low) 2.4474
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2892
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4474
    Shell Resolution(Low) 2.5348
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2885
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.2121
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5348
    Shell Resolution(Low) 2.6362
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2906
    R-Factor(R-Work) 0.197
    R-Factor(R-Free) 0.2249
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6362
    Shell Resolution(Low) 2.756
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2885
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2169
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.756
    Shell Resolution(Low) 2.9011
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2887
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9011
    Shell Resolution(Low) 3.0825
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2945
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.1989
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0825
    Shell Resolution(Low) 3.32
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2932
    R-Factor(R-Work) 0.1815
    R-Factor(R-Free) 0.2303
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.32
    Shell Resolution(Low) 3.6531
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2893
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.1861
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6531
    Shell Resolution(Low) 4.1794
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2836
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1794
    Shell Resolution(Low) 5.2569
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.1606
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2569
    Shell Resolution(Low) 24.4206
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2152
    Percent Reflections(Observed) 87.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.079
    f_dihedral_angle_d 17.698
    f_angle_d 0.912
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6242
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 881
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE: 1.5_2)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.5_2)
    model building AMoRE
    data collection CrystalClear