X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 5.5
Temperature 293.0
Details 0.1 M Bis-Tris and 10% (w/v) polyethylene glycol 3,350, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 162.12 α = 90
b = 64.79 β = 90.04
c = 50.23 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS VII -- 2010-11-13
Diffraction Radiation
Monochromator Protocol
SI 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 97.9 0.054 0.054 -- 4.0 -- 40018 -- 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.97 95.8 0.512 0.512 2.38 3.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 19.69 -- 0.1 -- 38401 1923 93.8 -- 0.186 0.185 0.216 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.903 1.9505 -- 109 2217 0.2359 0.2794 -- 80.0
X Ray Diffraction 1.9505 2.0032 -- 114 2387 0.2157 0.282 -- 86.0
X Ray Diffraction 2.0032 2.0621 -- 130 2454 0.1963 0.2414 -- 89.0
X Ray Diffraction 2.0621 2.1286 -- 140 2476 0.1925 0.233 -- 90.0
X Ray Diffraction 2.1286 2.2046 -- 139 2564 0.1885 0.2406 -- 93.0
X Ray Diffraction 2.2046 2.2927 -- 142 2629 0.1814 0.2263 -- 94.0
X Ray Diffraction 2.2927 2.3969 -- 109 2631 0.1912 0.2359 -- 94.0
X Ray Diffraction 2.3969 2.523 -- 142 2644 0.1866 0.2226 -- 96.0
X Ray Diffraction 2.523 2.6807 -- 130 2655 0.197 0.2272 -- 97.0
X Ray Diffraction 2.6807 2.8871 -- 140 2720 0.1905 0.2329 -- 97.0
X Ray Diffraction 2.8871 3.1766 -- 152 2727 0.1851 0.2052 -- 99.0
X Ray Diffraction 3.1766 3.6337 -- 169 2752 0.1691 0.224 -- 99.0
X Ray Diffraction 3.6337 4.5687 -- 162 2794 0.1531 0.1561 -- 100.0
X Ray Diffraction 4.5687 19.6945 -- 145 2828 0.178 0.2063 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -5.5479
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -0.7257
Anisotropic B[2][2] 6.8745
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.3266
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.068
f_dihedral_angle_d 18.171
f_angle_d 0.914
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3122
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 330

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
AMORE Structure Solution
PHENIX (PHENIX.REFINE: 1.5_2) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.5_2) refinement
AMoRE model building
CrystalClear data collection