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X-RAY DIFFRACTION
Materials and Methods page
4F7P
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.5
    Temperature 293.0
    Details 0.1 M Bis-Tris and 10% (w/v) polyethylene glycol 3,350, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 162.12 α = 90
    b = 64.79 β = 90.04
    c = 50.23 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS VII
    Collection Date 2010-11-13
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(Observed) 40018
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.054
    Redundancy 4.0
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.97
    Percent Possible(All) 95.8
    R Merge I(Observed) 0.512
    Mean I Over Sigma(Observed) 2.38
    R-Sym I(Observed) 0.512
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 19.69
    Cut-off Sigma(F) 0.1
    Number of Reflections(Observed) 38401
    Number of Reflections(R-Free) 1923
    Percent Reflections(Observed) 93.8
    R-Factor(Observed) 0.186
    R-Work 0.185
    R-Free 0.216
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -5.5479
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.7257
    Anisotropic B[2][2] 6.8745
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.3266
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.903
    Shell Resolution(Low) 1.9505
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2217
    R-Factor(R-Work) 0.2359
    R-Factor(R-Free) 0.2794
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9505
    Shell Resolution(Low) 2.0032
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2387
    R-Factor(R-Work) 0.2157
    R-Factor(R-Free) 0.282
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0032
    Shell Resolution(Low) 2.0621
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2454
    R-Factor(R-Work) 0.1963
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0621
    Shell Resolution(Low) 2.1286
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2476
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1286
    Shell Resolution(Low) 2.2046
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2046
    Shell Resolution(Low) 2.2927
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2263
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2927
    Shell Resolution(Low) 2.3969
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2359
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3969
    Shell Resolution(Low) 2.523
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1866
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.523
    Shell Resolution(Low) 2.6807
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.197
    R-Factor(R-Free) 0.2272
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6807
    Shell Resolution(Low) 2.8871
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2329
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8871
    Shell Resolution(Low) 3.1766
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2052
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1766
    Shell Resolution(Low) 3.6337
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2752
    R-Factor(R-Work) 0.1691
    R-Factor(R-Free) 0.224
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6337
    Shell Resolution(Low) 4.5687
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2794
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.1561
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5687
    Shell Resolution(Low) 19.6945
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2828
    R-Factor(R-Work) 0.178
    R-Factor(R-Free) 0.2063
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.068
    f_dihedral_angle_d 18.171
    f_angle_d 0.914
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3122
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 330
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution AMORE
    Structure Refinement PHENIX (PHENIX.REFINE: 1.5_2)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.5_2)
    model building AMoRE
    data collection CrystalClear