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X-RAY DIFFRACTION
Materials and Methods page
4F7M
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    Temperature 293.0
    Details 0.2 M sodium nitrate and 20% (w/v) polyethylene glycol 3,350, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 74.27 α = 90
    b = 67.09 β = 101.3
    c = 87.67 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS VII
    Collection Date 2010-11-13
     
    Diffraction Radiation
    Monochromator Si 111 channel
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(All) 33037
    Number Reflections(Observed) 33004
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.18
    Redundancy 4.1
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.49
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.483
    Mean I Over Sigma(Observed) 2.38
    R-Sym I(Observed) 0.483
    Redundancy 3.8
    Number Unique Reflections(All) 3267
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 40.671
    Cut-off Sigma(F) 0.15
    Number of Reflections(Observed) 31150
    Number of Reflections(R-Free) 1581
    Percent Reflections(Observed) 93.94
    R-Factor(Observed) 0.2417
    R-Work 0.2392
    R-Free 0.289
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.5793
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.6486
    Anisotropic B[2][2] -1.8467
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.7326
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4035
    Shell Resolution(Low) 2.481
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2304
    R-Factor(R-Work) 0.274
    R-Factor(R-Free) 0.3306
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.481
    Shell Resolution(Low) 2.5697
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.2728
    R-Factor(R-Free) 0.368
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5697
    Shell Resolution(Low) 2.6726
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.3385
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6726
    Shell Resolution(Low) 2.7942
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3469
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7942
    Shell Resolution(Low) 2.9415
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2602
    R-Factor(R-Free) 0.3158
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9415
    Shell Resolution(Low) 3.1257
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.259
    R-Factor(R-Free) 0.2953
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1257
    Shell Resolution(Low) 3.3669
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.2384
    R-Factor(R-Free) 0.298
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3669
    Shell Resolution(Low) 3.7055
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2832
    R-Factor(R-Work) 0.2196
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7055
    Shell Resolution(Low) 4.2413
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2807
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.248
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2413
    Shell Resolution(Low) 5.3416
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.1868
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3416
    Shell Resolution(Low) 40.6764
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 2885
    R-Factor(R-Work) 0.2411
    R-Factor(R-Free) 0.2542
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.05
    f_dihedral_angle_d 18.366
    f_angle_d 0.708
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6262
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 402
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.5_2)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.5_2)
    model building AMoRE
    data collection CrystalClear