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X-RAY DIFFRACTION
Materials and Methods page
4F7E
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 295.0
    Details 20% PEG4000, 200 mM potassium sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55.78 α = 90
    b = 74.48 β = 90
    c = 122.92 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details Rh coated flat mirror
    Collection Date 2012-02-03
     
    Diffraction Radiation
    Monochromator Side scattering bent cube-root I-beam single crystal, asymmetric cut 4.965 degrees
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 40
    Number Reflections(All) 20240
    Number Reflections(Observed) 20240
    Percent Possible(Observed) 97.4
    R Merge I(Observed) 0.067
    B(Isotropic) From Wilson Plot 45.6
    Redundancy 4.1
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.46
    Percent Possible(All) 98.2
    R Merge I(Observed) 0.199
    Mean I Over Sigma(Observed) 4.9
    Redundancy 4.1
    Number Unique Reflections(All) 1901
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 35.9
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 20132
    Number of Reflections(R-Free) 804
    Percent Reflections(Observed) 97.31
    R-Factor(All) 0.2233
    R-Factor(Observed) 0.2233
    R-Work 0.2211
    R-Free 0.2763
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 61.7012
    Anisotropic B[1][1] 0.07
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.05
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.03
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.462
    Number of Reflections(Observed) 1332
    Number of Reflections(R-Free) 55
    Number of Reflections(R-Work) 1277
    R-Factor(R-Work) 0.401
    R-Factor(R-Free) 0.39
    Percent Reflections(Observed) 98.52
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.007
    r_chiral_restr 0.088
    r_dihedral_angle_4_deg 21.572
    r_dihedral_angle_3_deg 16.911
    r_dihedral_angle_2_deg 35.365
    r_dihedral_angle_1_deg 6.161
    r_angle_refined_deg 1.4
    r_bond_refined_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2947
    Nucleic Acid Atoms 0
    Heterogen Atoms 97
    Solvent Atoms 26
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement REFMAC 5.6.0104
     
    Software
    data extraction pdb_extract version: 3.11
    refinement REFMAC5
    molecular replacement Phaser