X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 293.0
Details 10% (w/v) PEG8000, 0.1 M Tris pH 7, 0.2 M MgCl2., VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 104.81 α = 90
b = 107.78 β = 90
c = 127.31 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2011-10-09
Diffraction Radiation
Monochromator Protocol
Double silicon(111) crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.1 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.86 50 100.0 0.132 -- -- 7.1 13944 13944 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.9 3.97 100.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.856 49.626 -- 1.35 -- 13898 1393 98.57 -- 0.2044 0.1996 0.246 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.8559 3.9936 -- 127 1056 0.2791 0.3248 -- 86.0
X Ray Diffraction 3.9936 4.1535 -- 133 1233 0.2527 0.3057 -- 100.0
X Ray Diffraction 4.1535 4.3424 -- 136 1247 0.2333 0.2887 -- 100.0
X Ray Diffraction 4.3424 4.5712 -- 145 1258 0.2044 0.2736 -- 100.0
X Ray Diffraction 4.5712 4.8573 -- 139 1255 0.1697 0.2064 -- 100.0
X Ray Diffraction 4.8573 5.232 -- 138 1260 0.1772 0.2414 -- 100.0
X Ray Diffraction 5.232 5.7578 -- 136 1276 0.2182 0.2387 -- 100.0
X Ray Diffraction 5.7578 6.5893 -- 146 1272 0.2294 0.2894 -- 100.0
X Ray Diffraction 6.5893 8.2956 -- 141 1294 0.1853 0.2438 -- 100.0
X Ray Diffraction 8.2956 49.6305 -- 152 1354 0.1747 0.2027 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 29.283
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.1517
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 5.6658
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.055
f_bond_d 0.004
f_angle_d 0.84
f_dihedral_angle_d 15.964
f_plane_restr 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5714
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Software
Software Name Purpose
CBASS data collection
PHENIX model building
PHENIX refinement version: (phenix.refine: 1.7.2_869)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing