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X-RAY DIFFRACTION
Materials and Methods page
4F6L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 10% (w/v) PEG8000, 0.1 M Tris pH 7, 0.2 M MgCl2., VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.81 α = 90
    b = 107.78 β = 90
    c = 127.31 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-10-09
     
    Diffraction Radiation
    Monochromator Double silicon(111) crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.1
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.86
    Resolution(Low) 50
    Number Reflections(All) 13944
    Number Reflections(Observed) 13944
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.132
    Redundancy 7.1
     
    High Resolution Shell Details
    Resolution(High) 3.9
    Resolution(Low) 3.97
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.856
    Resolution(Low) 49.626
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 13898
    Number of Reflections(R-Free) 1393
    Percent Reflections(Observed) 98.57
    R-Factor(Observed) 0.2044
    R-Work 0.1996
    R-Free 0.246
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 29.283
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.1517
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.6658
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8559
    Shell Resolution(Low) 3.9936
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1056
    R-Factor(R-Work) 0.2791
    R-Factor(R-Free) 0.3248
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9936
    Shell Resolution(Low) 4.1535
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1233
    R-Factor(R-Work) 0.2527
    R-Factor(R-Free) 0.3057
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1535
    Shell Resolution(Low) 4.3424
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1247
    R-Factor(R-Work) 0.2333
    R-Factor(R-Free) 0.2887
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3424
    Shell Resolution(Low) 4.5712
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2736
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5712
    Shell Resolution(Low) 4.8573
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1255
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.2064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8573
    Shell Resolution(Low) 5.232
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1260
    R-Factor(R-Work) 0.1772
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.232
    Shell Resolution(Low) 5.7578
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1276
    R-Factor(R-Work) 0.2182
    R-Factor(R-Free) 0.2387
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7578
    Shell Resolution(Low) 6.5893
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1272
    R-Factor(R-Work) 0.2294
    R-Factor(R-Free) 0.2894
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5893
    Shell Resolution(Low) 8.2956
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1294
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2956
    Shell Resolution(Low) 49.6305
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1354
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2027
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.055
    f_dihedral_angle_d 15.964
    f_angle_d 0.84
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5714
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHENIX
    data collection CBASS