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X-RAY DIFFRACTION
Materials and Methods page
4F6H
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 25 mMTris-HCl containing 1 mM zinc sulfate at pH 7.0, and mother liquor containing 0.8M di-sodium hydrogen phosphate, 0.8 M di-potassium hydrogen phosphate, and 0.1 M HEPES at pH 7.5., VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.02 α = 90
    b = 60.5 β = 90
    c = 84.29 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-10-25
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 0.9774
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.74
    Resolution(Low) 30.25
    Number Reflections(All) 26059
    Number Reflections(Observed) 26059
    Percent Possible(Observed) 97.5
    R Merge I(Observed) 0.036
     
    High Resolution Shell Details
    Resolution(High) 1.74
    Resolution(Low) 1.81
    Percent Possible(All) 89.2
    R Merge I(Observed) 0.306
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.744
    Resolution(Low) 30.249
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 26059
    Number of Reflections(Observed) 26018
    Number of Reflections(R-Free) 1308
    Percent Reflections(Observed) 97.3
    R-Factor(Observed) 0.1974
    R-Work 0.1959
    R-Free 0.2259
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.3142
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.2064
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.1077
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7439
    Shell Resolution(Low) 1.8137
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.355
    R-Factor(R-Free) 0.3718
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8137
    Shell Resolution(Low) 1.8962
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2806
    R-Factor(R-Work) 0.2692
    R-Factor(R-Free) 0.3491
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8962
    Shell Resolution(Low) 1.9962
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2778
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9962
    Shell Resolution(Low) 2.1212
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2353
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1212
    Shell Resolution(Low) 2.2849
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.2048
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2849
    Shell Resolution(Low) 2.5148
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2013
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5148
    Shell Resolution(Low) 2.8784
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2752
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2597
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8784
    Shell Resolution(Low) 3.6255
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2212
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6255
    Shell Resolution(Low) 30.254
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2845
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.1851
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.067
    f_dihedral_angle_d 11.042
    f_angle_d 0.987
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1746
    Nucleic Acid Atoms 0
    Heterogen Atoms 21
    Solvent Atoms 178
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection HKL-2000