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X-RAY DIFFRACTION
Materials and Methods page
4F5P
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 291.0
    Details 50mM Imidazole, 350mM Sodium Acetate, 19% PEG3350, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.38 α = 90
    b = 79.24 β = 105.49
    c = 54.88 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 92
    Details Mirrors
    Collection Date 2011-09-25
     
    Diffraction Radiation
    Monochromator mirrors VarimaxHF
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.85
    Resolution(Low) 28
    Number Reflections(All) 185280
    Number Reflections(Observed) 185280
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.049
    Redundancy 4.9
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.92
    Percent Possible(All) 97.2
    R Merge I(Observed) 0.367
    Mean I Over Sigma(Observed) 2.34
    Redundancy 2.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 22.109
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 36292
    Number of Reflections(Observed) 36292
    Number of Reflections(R-Free) 3663
    Percent Reflections(Observed) 93.86
    R-Factor(Observed) 0.2071
    R-Work 0.2028
    R-Free 0.2452
     
    Temperature Factor Modeling
    Isotropic Thermal Model Restrained
    Anisotropic B[1][1] 2.4138
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.4155
    Anisotropic B[2][2] -3.1888
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.775
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8445
    Shell Resolution(Low) 1.8688
    Number of Reflections(R-Free) 74
    Number of Reflections(R-Work) 613
    R-Factor(R-Work) 0.2567
    R-Factor(R-Free) 0.3213
    Percent Reflections(Observed) 47.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8688
    Shell Resolution(Low) 1.8944
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1086
    R-Factor(R-Work) 0.2624
    R-Factor(R-Free) 0.3591
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8944
    Shell Resolution(Low) 1.9214
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 1094
    R-Factor(R-Work) 0.2545
    R-Factor(R-Free) 0.3075
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9214
    Shell Resolution(Low) 1.9501
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1190
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.314
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9501
    Shell Resolution(Low) 1.9805
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1172
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.2737
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9805
    Shell Resolution(Low) 2.013
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1228
    R-Factor(R-Work) 0.235
    R-Factor(R-Free) 0.2681
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.013
    Shell Resolution(Low) 2.0477
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1251
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.2888
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0477
    Shell Resolution(Low) 2.0849
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1310
    R-Factor(R-Work) 0.2212
    R-Factor(R-Free) 0.2851
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0849
    Shell Resolution(Low) 2.1249
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1269
    R-Factor(R-Work) 0.2175
    R-Factor(R-Free) 0.2733
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1249
    Shell Resolution(Low) 2.1683
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1300
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2868
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1683
    Shell Resolution(Low) 2.2154
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1296
    R-Factor(R-Work) 0.2161
    R-Factor(R-Free) 0.2934
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2154
    Shell Resolution(Low) 2.2669
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1320
    R-Factor(R-Work) 0.2089
    R-Factor(R-Free) 0.2825
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2669
    Shell Resolution(Low) 2.3235
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1241
    R-Factor(R-Work) 0.2121
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3235
    Shell Resolution(Low) 2.3862
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1320
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2827
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3862
    Shell Resolution(Low) 2.4564
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1333
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2614
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4564
    Shell Resolution(Low) 2.5356
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1310
    R-Factor(R-Work) 0.2321
    R-Factor(R-Free) 0.3172
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5356
    Shell Resolution(Low) 2.626
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1280
    R-Factor(R-Work) 0.2359
    R-Factor(R-Free) 0.2719
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.626
    Shell Resolution(Low) 2.731
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1313
    R-Factor(R-Work) 0.2133
    R-Factor(R-Free) 0.281
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.731
    Shell Resolution(Low) 2.855
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1316
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.855
    Shell Resolution(Low) 3.0052
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1319
    R-Factor(R-Work) 0.2224
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0052
    Shell Resolution(Low) 3.193
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 1298
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.2555
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.193
    Shell Resolution(Low) 3.4387
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1343
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.2416
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4387
    Shell Resolution(Low) 3.7832
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1326
    R-Factor(R-Work) 0.1899
    R-Factor(R-Free) 0.2192
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7832
    Shell Resolution(Low) 4.327
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1373
    R-Factor(R-Work) 0.1618
    R-Factor(R-Free) 0.2319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.327
    Shell Resolution(Low) 5.4382
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1351
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4382
    Shell Resolution(Low) 22.1104
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1377
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.101
    f_dihedral_angle_d 20.258
    f_angle_d 1.231
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2580
    Nucleic Acid Atoms 632
    Heterogen Atoms 33
    Solvent Atoms 292
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building CNS
    data collection StructureStudio