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X-RAY DIFFRACTION
Materials and Methods page
4F5O
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 291.0
    Details 50mM Imidazole, 350mM Sodium Acetate, 19% PEG3350, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.48 α = 90
    b = 78.92 β = 106.61
    c = 55.13 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 92
    Details Mirrors
    Collection Date 2011-05-03
     
    Diffraction Radiation
    Monochromator mirrors VarimaxHF
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2
    Resolution(Low) 28
    Number Reflections(All) 151838
    Number Reflections(Observed) 151838
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.056
    B(Isotropic) From Wilson Plot 30.93
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 98.1
    R Merge I(Observed) 0.379
    Mean I Over Sigma(Observed) 2.8
    Redundancy 3.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 22.572
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 28802
    Number of Reflections(Observed) 28802
    Number of Reflections(R-Free) 2890
    Percent Reflections(Observed) 94.8
    R-Factor(All) 0.2096
    R-Factor(Observed) 0.2096
    R-Work 0.2032
    R-Free 0.2673
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Isotropic Thermal Model Restrained
    Mean Isotropic B Value 30.93
    Anisotropic B[1][1] 1.8542
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.3066
    Anisotropic B[2][2] 1.8518
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.706
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9977
    Shell Resolution(Low) 2.0304
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 1107
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.3087
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0304
    Shell Resolution(Low) 2.0654
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1177
    R-Factor(R-Work) 0.2358
    R-Factor(R-Free) 0.3033
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0654
    Shell Resolution(Low) 2.103
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 1243
    R-Factor(R-Work) 0.2225
    R-Factor(R-Free) 0.2857
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.103
    Shell Resolution(Low) 2.1434
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1226
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.2415
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1434
    Shell Resolution(Low) 2.1871
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1286
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.2994
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1871
    Shell Resolution(Low) 2.2346
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1215
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.2871
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2346
    Shell Resolution(Low) 2.2865
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1215
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.3195
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2865
    Shell Resolution(Low) 2.3437
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1199
    R-Factor(R-Work) 0.248
    R-Factor(R-Free) 0.3486
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3437
    Shell Resolution(Low) 2.407
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 1230
    R-Factor(R-Work) 0.264
    R-Factor(R-Free) 0.3586
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.407
    Shell Resolution(Low) 2.4777
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 1196
    R-Factor(R-Work) 0.254
    R-Factor(R-Free) 0.3433
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4777
    Shell Resolution(Low) 2.5576
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1188
    R-Factor(R-Work) 0.276
    R-Factor(R-Free) 0.4152
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5576
    Shell Resolution(Low) 2.6488
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1205
    R-Factor(R-Work) 0.2491
    R-Factor(R-Free) 0.358
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6488
    Shell Resolution(Low) 2.7547
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1213
    R-Factor(R-Work) 0.2237
    R-Factor(R-Free) 0.276
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7547
    Shell Resolution(Low) 2.8799
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1171
    R-Factor(R-Work) 0.2242
    R-Factor(R-Free) 0.3023
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8799
    Shell Resolution(Low) 3.0314
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 1219
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.3144
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0314
    Shell Resolution(Low) 3.2208
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.2154
    R-Factor(R-Free) 0.2715
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2208
    Shell Resolution(Low) 3.4686
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1313
    R-Factor(R-Work) 0.2017
    R-Factor(R-Free) 0.2694
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4686
    Shell Resolution(Low) 3.8162
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1302
    R-Factor(R-Work) 0.1839
    R-Factor(R-Free) 0.2566
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8162
    Shell Resolution(Low) 4.3649
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1312
    R-Factor(R-Work) 0.1537
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3649
    Shell Resolution(Low) 5.4863
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1293
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4863
    Shell Resolution(Low) 22.5732
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1343
    R-Factor(R-Work) 0.1859
    R-Factor(R-Free) 0.2102
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.064
    f_dihedral_angle_d 20.786
    f_angle_d 1.057
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2537
    Nucleic Acid Atoms 633
    Heterogen Atoms 31
    Solvent Atoms 282
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building CNS
    data collection StructureStudio