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X-RAY DIFFRACTION
Materials and Methods page
4F5J
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5
    Temperature 277.0
    Details 8% PEG 4000, 0.1 M Sodium Acetate, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 59.71 α = 90
    b = 102.99 β = 90
    c = 139.34 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 85
     
    Diffraction Detector
    Detector CCD
    Type BRUKER SMART 6000
    Details Mirrors
    Collection Date 2010-08-07
     
    Diffraction Radiation
    Monochromator Osmic Mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU300
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.95
    Resolution(Low) 100
    Number Reflections(All) 63173
    Number Reflections(Observed) 63086
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.0844
    B(Isotropic) From Wilson Plot 17.9
    Redundancy 5.76
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.05
    Percent Possible(All) 99.0
    R Merge I(Observed) 0.4078
    Mean I Over Sigma(Observed) 2.32
    R-Sym I(Observed) 0.4078
    Redundancy 3.78
    Number Unique Reflections(All) 8303
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.954
    Resolution(Low) 51.653
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 62990
    Number of Reflections(R-Free) 3112
    Percent Reflections(Observed) 99.9
    R-Factor(Observed) 0.1634
    R-Work 0.1614
    R-Free 0.2036
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.8311
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.3769
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.4542
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.954
    Shell Resolution(Low) 1.9846
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.2289
    R-Factor(R-Free) 0.2738
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9846
    Shell Resolution(Low) 2.0171
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.2092
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0171
    Shell Resolution(Low) 2.0519
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0519
    Shell Resolution(Low) 2.0892
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.2615
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0892
    Shell Resolution(Low) 2.1294
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2102
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1294
    Shell Resolution(Low) 2.1728
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1623
    R-Factor(R-Free) 0.2162
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1728
    Shell Resolution(Low) 2.2201
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.2279
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2201
    Shell Resolution(Low) 2.2717
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2717
    Shell Resolution(Low) 2.3285
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.2359
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3285
    Shell Resolution(Low) 2.3915
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.1866
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3915
    Shell Resolution(Low) 2.4619
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4619
    Shell Resolution(Low) 2.5413
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1611
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5413
    Shell Resolution(Low) 2.6321
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6321
    Shell Resolution(Low) 2.7375
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7375
    Shell Resolution(Low) 2.8621
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.1974
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8621
    Shell Resolution(Low) 3.013
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.1994
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.013
    Shell Resolution(Low) 3.2017
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.2012
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2017
    Shell Resolution(Low) 3.4489
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.1584
    R-Factor(R-Free) 0.1905
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4489
    Shell Resolution(Low) 3.7959
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.187
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7959
    Shell Resolution(Low) 4.3449
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2782
    R-Factor(R-Work) 0.1354
    R-Factor(R-Free) 0.1566
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3449
    Shell Resolution(Low) 5.4732
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.1492
    R-Factor(R-Free) 0.1752
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4732
    Shell Resolution(Low) 51.6711
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2961
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.201
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 12.937
    f_angle_d 1.065
    f_bond_d 0.007
     
    Coordinate Error
    Luzzati Sigma A(Observed) 0.47
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6168
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 942
     
     
  •   Software and Computing Hide
    Computing
    Data Collection PROTEUM PLUS
    Data Reduction (intensity integration) PROTEUM PLUS
    Data Reduction (data scaling) PROTEUM PLUS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection PROTEUM version: PLUS