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X-RAY DIFFRACTION
Materials and Methods page
4F5I
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 277.0
    Details 8% PEG 4000, 0.1 M Sodium Acetate, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 59.96 α = 90
    b = 103.07 β = 90
    c = 138.83 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 85
     
    Diffraction Detector
    Detector CCD
    Type BRUKER SMART 6000
    Details Osmic Mirrors
    Collection Date 2010-07-14
     
    Diffraction Radiation
    Monochromator Osmic Mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU300
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.2
    Resolution(Low) 100
    Number Reflections(All) 44573
    Number Reflections(Observed) 44527
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.0557
    B(Isotropic) From Wilson Plot 23.8
    Redundancy 11.14
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.29
    Percent Possible(All) 99.2
    R Merge I(Observed) 0.311
    Mean I Over Sigma(Observed) 3.34
    R-Sym I(Observed) 0.311
    Redundancy 6.41
    Number Unique Reflections(All) 4959
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 42.217
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 44444
    Number of Reflections(R-Free) 2149
    Percent Reflections(Observed) 99.89
    R-Factor(Observed) 0.1747
    R-Work 0.1728
    R-Free 0.2116
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.7269
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.0667
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.7936
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.2512
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.2163
    R-Factor(R-Free) 0.3016
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2512
    Shell Resolution(Low) 2.3075
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2776
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3075
    Shell Resolution(Low) 2.3699
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.2086
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3699
    Shell Resolution(Low) 2.4396
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2799
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2692
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4396
    Shell Resolution(Low) 2.5183
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.1953
    R-Factor(R-Free) 0.2221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5183
    Shell Resolution(Low) 2.6083
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6083
    Shell Resolution(Low) 2.7127
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2083
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7127
    Shell Resolution(Low) 2.8362
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2797
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.2239
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8362
    Shell Resolution(Low) 2.9857
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2820
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2031
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9857
    Shell Resolution(Low) 3.1727
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.2356
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1727
    Shell Resolution(Low) 3.4175
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2833
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.2163
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4175
    Shell Resolution(Low) 3.7613
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.1853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7613
    Shell Resolution(Low) 4.3051
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.1396
    R-Factor(R-Free) 0.1602
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3051
    Shell Resolution(Low) 5.4221
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2897
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1914
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4221
    Shell Resolution(Low) 42.2252
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 3028
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 12.909
    f_angle_d 1.039
    f_bond_d 0.008
     
    Coordinate Error
    Luzzati Sigma A(Observed) 0.62
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6198
    Nucleic Acid Atoms 0
    Heterogen Atoms 8
    Solvent Atoms 743
     
     
  •   Software and Computing Hide
    Computing
    Data Collection PROTEUM PLUS
    Data Reduction (intensity integration) PROTEUM PLUS
    Data Reduction (data scaling) PROTEUM PLUS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection PROTEUM version: PLUS