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X-RAY DIFFRACTION
Materials and Methods page
4F5H
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.6
    Temperature 277.0
    Details 8% PEG 4000, 0.1 M Sodium Acetate, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.13 α = 90
    b = 109.79 β = 90
    c = 141.67 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-06-11
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL7-1
    Wavelength List 0.97946
    Site SSRL
    Beamline BL7-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.6
    Resolution(Low) 50
    Number Reflections(All) 119994
    Number Reflections(Observed) 118914
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.052
    B(Isotropic) From Wilson Plot 18.16
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.64
    Percent Possible(All) 98.6
    R Merge I(Observed) 0.367
    Mean I Over Sigma(Observed) 2.6
    R-Sym I(Observed) 0.367
    Redundancy 3.7
    Number Unique Reflections(All) 8625
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 19.955
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 118766
    Number of Reflections(R-Free) 5936
    Percent Reflections(Observed) 98.91
    R-Factor(Observed) 0.1624
    R-Work 0.1611
    R-Free 0.1869
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.2325
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0861
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.1464
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6
    Shell Resolution(Low) 1.6182
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3682
    R-Factor(R-Work) 0.2417
    R-Factor(R-Free) 0.2748
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6182
    Shell Resolution(Low) 1.6372
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3667
    R-Factor(R-Work) 0.2378
    R-Factor(R-Free) 0.2864
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6372
    Shell Resolution(Low) 1.6572
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3710
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6572
    Shell Resolution(Low) 1.6781
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3696
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6781
    Shell Resolution(Low) 1.7002
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3713
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2265
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7002
    Shell Resolution(Low) 1.7235
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 3700
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2353
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7235
    Shell Resolution(Low) 1.7481
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3695
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.2154
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7481
    Shell Resolution(Low) 1.7742
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3726
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7742
    Shell Resolution(Low) 1.8019
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3685
    R-Factor(R-Work) 0.1664
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8019
    Shell Resolution(Low) 1.8314
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3748
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8314
    Shell Resolution(Low) 1.863
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3702
    R-Factor(R-Work) 0.161
    R-Factor(R-Free) 0.2144
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.863
    Shell Resolution(Low) 1.8968
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3733
    R-Factor(R-Work) 0.1533
    R-Factor(R-Free) 0.2012
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8968
    Shell Resolution(Low) 1.9333
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3778
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9333
    Shell Resolution(Low) 1.9727
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3726
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.1865
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9727
    Shell Resolution(Low) 2.0155
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 3725
    R-Factor(R-Work) 0.1532
    R-Factor(R-Free) 0.1832
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0155
    Shell Resolution(Low) 2.0624
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 3709
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1761
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0624
    Shell Resolution(Low) 2.1139
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3764
    R-Factor(R-Work) 0.1567
    R-Factor(R-Free) 0.1899
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1139
    Shell Resolution(Low) 2.171
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3777
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1854
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.171
    Shell Resolution(Low) 2.2348
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3802
    R-Factor(R-Work) 0.1501
    R-Factor(R-Free) 0.1686
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2348
    Shell Resolution(Low) 2.3068
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3757
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.181
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3068
    Shell Resolution(Low) 2.3891
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 3769
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1879
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3891
    Shell Resolution(Low) 2.4846
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3765
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.1767
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4846
    Shell Resolution(Low) 2.5975
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3838
    R-Factor(R-Work) 0.1607
    R-Factor(R-Free) 0.1828
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5975
    Shell Resolution(Low) 2.7341
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 3799
    R-Factor(R-Work) 0.1595
    R-Factor(R-Free) 0.1812
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7341
    Shell Resolution(Low) 2.9049
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3850
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.191
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9049
    Shell Resolution(Low) 3.1284
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3813
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.1859
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1284
    Shell Resolution(Low) 3.4418
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3861
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1658
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4418
    Shell Resolution(Low) 3.9365
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3741
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.1784
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9365
    Shell Resolution(Low) 4.9471
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3938
    R-Factor(R-Work) 0.1414
    R-Factor(R-Free) 0.1535
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9471
    Shell Resolution(Low) 19.9565
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3961
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 12.83
    f_angle_d 1.083
    f_bond_d 0.006
     
    Coordinate Error
    Luzzati Sigma A(Observed) 0.41
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6177
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 968
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection BLU-ICE