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X-RAY DIFFRACTION
Materials and Methods page
4F5G
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5
    Temperature 277.0
    Details 8% PEG 4000, 0.1 M Sodium Acetate, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.3 α = 90
    b = 102.57 β = 90
    c = 139.54 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 85
     
    Diffraction Detector
    Detector CCD
    Type BRUKER SMART 6000
    Details Mirrors
    Collection Date 2010-08-13
     
    Diffraction Radiation
    Monochromator Osmic Mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RU300
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.67
    Resolution(Low) 57.69
    Number Reflections(All) 94375
    Number Reflections(Observed) 93933
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.0532
    B(Isotropic) From Wilson Plot 17.5
    Redundancy 5.78
     
    High Resolution Shell Details
    Resolution(High) 1.67
    Resolution(Low) 1.68
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.375
    Mean I Over Sigma(Observed) 2.5
    R-Sym I(Observed) 0.375
    Redundancy 3.25
    Number Unique Reflections(All) 13251
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.67
    Resolution(Low) 57.689
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 93836
    Number of Reflections(R-Free) 4671
    Percent Reflections(Observed) 95.18
    R-Factor(Observed) 0.1646
    R-Work 0.1633
    R-Free 0.1905
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.1499
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.2124
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.9374
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.67
    Shell Resolution(Low) 1.684
    Number of Reflections(R-Free) 22
    Number of Reflections(R-Work) 402
    R-Factor(R-Work) 0.2718
    R-Factor(R-Free) 0.3601
    Percent Reflections(Observed) 13.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.684
    Shell Resolution(Low) 1.7038
    Number of Reflections(R-Free) 93
    Number of Reflections(R-Work) 1678
    R-Factor(R-Work) 0.251
    R-Factor(R-Free) 0.3191
    Percent Reflections(Observed) 55.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7038
    Shell Resolution(Low) 1.7246
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3009
    R-Factor(R-Work) 0.2393
    R-Factor(R-Free) 0.2909
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7246
    Shell Resolution(Low) 1.7464
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3058
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7464
    Shell Resolution(Low) 1.7694
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3088
    R-Factor(R-Work) 0.211
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7694
    Shell Resolution(Low) 1.7936
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3059
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2284
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7936
    Shell Resolution(Low) 1.8193
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3093
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2796
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8193
    Shell Resolution(Low) 1.8464
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3045
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8464
    Shell Resolution(Low) 1.8753
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3083
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2136
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8753
    Shell Resolution(Low) 1.906
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3026
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.906
    Shell Resolution(Low) 1.9389
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3062
    R-Factor(R-Work) 0.163
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9389
    Shell Resolution(Low) 1.9742
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 2996
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.2027
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9742
    Shell Resolution(Low) 2.0121
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3100
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.188
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0121
    Shell Resolution(Low) 2.0532
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3038
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0532
    Shell Resolution(Low) 2.0978
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3095
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.2052
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0978
    Shell Resolution(Low) 2.1467
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3076
    R-Factor(R-Work) 0.1583
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1467
    Shell Resolution(Low) 2.2003
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3105
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2003
    Shell Resolution(Low) 2.2598
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3094
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.1825
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2598
    Shell Resolution(Low) 2.3263
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3108
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1826
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3263
    Shell Resolution(Low) 2.4014
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3106
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.1912
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4014
    Shell Resolution(Low) 2.4872
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3127
    R-Factor(R-Work) 0.1515
    R-Factor(R-Free) 0.1711
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4872
    Shell Resolution(Low) 2.5868
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3121
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5868
    Shell Resolution(Low) 2.7046
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3128
    R-Factor(R-Work) 0.1518
    R-Factor(R-Free) 0.1785
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7046
    Shell Resolution(Low) 2.8471
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3134
    R-Factor(R-Work) 0.156
    R-Factor(R-Free) 0.1742
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8471
    Shell Resolution(Low) 3.0255
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3174
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.1753
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0255
    Shell Resolution(Low) 3.2591
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3163
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.1556
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2591
    Shell Resolution(Low) 3.587
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3182
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.179
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.587
    Shell Resolution(Low) 4.106
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3191
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.1555
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.106
    Shell Resolution(Low) 5.1726
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3236
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1669
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1726
    Shell Resolution(Low) 57.7238
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3388
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.2199
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 12.712
    f_angle_d 1.152
    f_bond_d 0.007
     
    Coordinate Error
    Luzzati Sigma A(Observed) 0.38
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6162
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 1060
     
     
  •   Software and Computing Hide
    Computing
    Data Collection PROTEUM PLUS
    Data Reduction (intensity integration) PROTEUM PLUS
    Data Reduction (data scaling) PROTEUM PLUS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection PROTEUM version: PLUS