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X-RAY DIFFRACTION
Materials and Methods page
4F57
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 296.0
    Details 0.17 M (NH4)2SO4, 0.085 M cacodylate pH 6.5, 25.5% (w/v) polyethylene glycol (PEG) 8000, and 15% (v/v) glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 152.1 α = 90
    b = 57.46 β = 112.78
    c = 60.04 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2011-11-27
     
    Diffraction Radiation
    Monochromator Mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-D
    Wavelength List 1.03319
    Site APS
    Beamline 23-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.7
    Resolution(Low) 41.5
    Number Reflections(All) 52788
    Number Reflections(Observed) 50571
    Percent Possible(Observed) 95.8
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.73
    Percent Possible(All) 81.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 41.5
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 52817
    Number of Reflections(Observed) 50557
    Number of Reflections(R-Free) 2567
    Percent Reflections(Observed) 95.72
    R-Factor(Observed) 0.1877
    R-Work 0.1865
    R-Free 0.2091
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.1969
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -4.3672
    Anisotropic B[2][2] -4.9677
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.7708
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.7315
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2227
    R-Factor(R-Work) 0.2429
    R-Factor(R-Free) 0.2659
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7315
    Shell Resolution(Low) 1.7668
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2427
    R-Factor(R-Work) 0.2537
    R-Factor(R-Free) 0.2756
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7668
    Shell Resolution(Low) 1.8052
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.2392
    R-Factor(R-Free) 0.2748
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8052
    Shell Resolution(Low) 1.8472
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.2409
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8472
    Shell Resolution(Low) 1.8934
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.2202
    R-Factor(R-Free) 0.2654
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8934
    Shell Resolution(Low) 1.9446
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2242
    R-Factor(R-Free) 0.2817
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9446
    Shell Resolution(Low) 2.0018
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0018
    Shell Resolution(Low) 2.0664
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0664
    Shell Resolution(Low) 2.1403
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2369
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1403
    Shell Resolution(Low) 2.226
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2072
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.226
    Shell Resolution(Low) 2.3273
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2916
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3273
    Shell Resolution(Low) 2.4499
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.246
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4499
    Shell Resolution(Low) 2.6034
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.2544
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6034
    Shell Resolution(Low) 2.8044
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.1927
    R-Factor(R-Free) 0.1886
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8044
    Shell Resolution(Low) 3.0865
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0865
    Shell Resolution(Low) 3.533
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2783
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.1765
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.533
    Shell Resolution(Low) 4.4503
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2775
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.1522
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4503
    Shell Resolution(Low) 41.5247
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.181
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 12.492
    f_angle_d 1.114
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3296
    Nucleic Acid Atoms 0
    Heterogen Atoms 6
    Solvent Atoms 532
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu-Ice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building MOLREP
    data collection Blu-Ice