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X-RAY DIFFRACTION
Materials and Methods page
4F50
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.1
    Temperature 298.0
    Details 10% PEG-3350, 100 mM Ca(OAc)2, 100 mM HEPES, 2.5% Glycerol, pH 7.1, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 124.48 α = 90
    b = 124.48 β = 90
    c = 70.47 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2007-10-18
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 0.9795
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.21
    Resolution(Low) 30
    Number Reflections(All) 28140
    Number Reflections(Observed) 27408
    Percent Possible(Observed) 97.4
    R Merge I(Observed) 0.051
    Redundancy 9.7
     
    High Resolution Shell Details
    Resolution(High) 2.22
    Resolution(Low) 2.26
    Percent Possible(All) 79.9
    R Merge I(Observed) 0.353
    Mean I Over Sigma(Observed) 2.2
    Redundancy 3.8
    Number Unique Reflections(All) 1092
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.215
    Resolution(Low) 28.468
    Cut-off Sigma(F) 1.49
    Number of Reflections(Observed) 27377
    Number of Reflections(R-Free) 1365
    Percent Reflections(Observed) 97.41
    R-Factor(Observed) 0.2145
    R-Work 0.2117
    R-Free 0.2691
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.2801
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.2801
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -10.5602
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.215
    Shell Resolution(Low) 2.2939
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2190
    R-Factor(R-Work) 0.3062
    R-Factor(R-Free) 0.322
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2939
    Shell Resolution(Low) 2.3857
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.3075
    R-Factor(R-Free) 0.3583
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3857
    Shell Resolution(Low) 2.4943
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2907
    R-Factor(R-Free) 0.3747
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4943
    Shell Resolution(Low) 2.6257
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.2776
    R-Factor(R-Free) 0.335
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6257
    Shell Resolution(Low) 2.7901
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.3661
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7901
    Shell Resolution(Low) 3.0053
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.2442
    R-Factor(R-Free) 0.303
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0053
    Shell Resolution(Low) 3.3073
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.2133
    R-Factor(R-Free) 0.3028
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3073
    Shell Resolution(Low) 3.7849
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1959
    R-Factor(R-Free) 0.2616
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7849
    Shell Resolution(Low) 4.7649
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7649
    Shell Resolution(Low) 28.4707
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.1906
    R-Factor(R-Free) 0.2378
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 18.769
    f_angle_d 1.227
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2693
    Nucleic Acid Atoms 466
    Heterogen Atoms 1
    Solvent Atoms 74
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER in PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER version: in PHENIX
    data collection CBASS