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X-RAY DIFFRACTION
Materials and Methods page
4F4Z
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details 10% PEG-3350, 100 mM Ca(OAc)2, 100 mM HEPES, 2.5% Glycerol, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.97 α = 75.6
    b = 51.2 β = 82.97
    c = 98.84 γ = 70.14
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2007-10-18
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 0.9795
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 30
    Number Reflections(All) 25946
    Number Reflections(Observed) 21042
    Percent Possible(Observed) 81.1
    R Merge I(Observed) 0.03
    Redundancy 1.8
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.34
    Percent Possible(All) 50.5
    R Merge I(Observed) 0.19
    Mean I Over Sigma(Observed) 2.0
    Redundancy 1.4
    Number Unique Reflections(All) 947
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.305
    Resolution(Low) 27.065
    Cut-off Sigma(F) 2.21
    Number of Reflections(R-Free) 1589
    Percent Reflections(Observed) 80.8
    R-Factor(Observed) 0.1883
    R-Work 0.1847
    R-Free 0.26
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.1877
    Anisotropic B[1][2] 2.6214
    Anisotropic B[1][3] 2.4321
    Anisotropic B[2][2] 1.3028
    Anisotropic B[2][3] 1.8895
    Anisotropic B[3][3] -3.4905
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3046
    Shell Resolution(Low) 2.379
    Number of Reflections(R-Free) 94
    Number of Reflections(R-Work) 1801
    R-Factor(R-Work) 0.2925
    R-Factor(R-Free) 0.4181
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.379
    Shell Resolution(Low) 2.4639
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2211
    R-Factor(R-Work) 0.2579
    R-Factor(R-Free) 0.3064
    Percent Reflections(Observed) 63.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4639
    Shell Resolution(Low) 2.5625
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2449
    R-Factor(R-Work) 0.2351
    R-Factor(R-Free) 0.3174
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5625
    Shell Resolution(Low) 2.679
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.2449
    R-Factor(R-Free) 0.3155
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.679
    Shell Resolution(Low) 2.8201
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2535
    R-Factor(R-Free) 0.3382
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8201
    Shell Resolution(Low) 2.9966
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2920
    R-Factor(R-Work) 0.2557
    R-Factor(R-Free) 0.3188
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9966
    Shell Resolution(Low) 3.2276
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3055
    R-Factor(R-Work) 0.2257
    R-Factor(R-Free) 0.3287
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2276
    Shell Resolution(Low) 3.5518
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3232
    R-Factor(R-Work) 0.1887
    R-Factor(R-Free) 0.2627
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5518
    Shell Resolution(Low) 4.0643
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3310
    R-Factor(R-Work) 0.1689
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0643
    Shell Resolution(Low) 5.1149
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3388
    R-Factor(R-Work) 0.1424
    R-Factor(R-Free) 0.2063
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1149
    Shell Resolution(Low) 27.0673
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3276
    R-Factor(R-Work) 0.1605
    R-Factor(R-Free) 0.2355
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.076
    f_dihedral_angle_d 18.282
    f_angle_d 1.142
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5440
    Nucleic Acid Atoms 997
    Heterogen Atoms 3
    Solvent Atoms 91
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER in PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER version: in PHENIX
    data collection CBASS