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X-RAY DIFFRACTION
Materials and Methods page
4F4W
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.9
    Temperature 298.0
    Details 10% PEG-3350, 100 mM Ca(OAc)2, 100 mM MES/Tris, 2.5% Glycerol, pH 5.9, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 52.82 α = 90
    b = 99.65 β = 90.16
    c = 101.62 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-02-06
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 30
    Number Reflections(All) 83084
    Number Reflections(Observed) 80176
    Percent Possible(Observed) 96.5
    R Merge I(Observed) 0.039
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.93
    Percent Possible(All) 81.1
    R Merge I(Observed) 0.166
    Mean I Over Sigma(Observed) 3.8
    Redundancy 2.5
    Number Unique Reflections(All) 3345
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.898
    Resolution(Low) 28.014
    Cut-off Sigma(F) 1.54
    Number of Reflections(Observed) 80155
    Number of Reflections(R-Free) 1927
    Percent Reflections(Observed) 96.52
    R-Factor(Observed) 0.1873
    R-Work 0.1865
    R-Free 0.2189
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.1495
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.2172
    Anisotropic B[2][2] 6.1347
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.9852
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.898
    Shell Resolution(Low) 1.9458
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 4854
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.2484
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9458
    Shell Resolution(Low) 1.9983
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 5374
    R-Factor(R-Work) 0.2049
    R-Factor(R-Free) 0.2602
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9983
    Shell Resolution(Low) 2.0571
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 5456
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0571
    Shell Resolution(Low) 2.1235
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 5562
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2428
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1235
    Shell Resolution(Low) 2.1994
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 5606
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1994
    Shell Resolution(Low) 2.2874
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 5606
    R-Factor(R-Work) 0.2003
    R-Factor(R-Free) 0.2015
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2874
    Shell Resolution(Low) 2.3914
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 5637
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.2822
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3914
    Shell Resolution(Low) 2.5175
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5670
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.243
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5175
    Shell Resolution(Low) 2.6751
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 5692
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.29
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6751
    Shell Resolution(Low) 2.8814
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 5712
    R-Factor(R-Work) 0.2084
    R-Factor(R-Free) 0.2744
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8814
    Shell Resolution(Low) 3.171
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 5770
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2005
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.171
    Shell Resolution(Low) 3.629
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5752
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2133
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.629
    Shell Resolution(Low) 4.569
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 5788
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.184
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.569
    Shell Resolution(Low) 28.0171
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 5749
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.1943
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.079
    f_dihedral_angle_d 18.228
    f_angle_d 1.493
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5476
    Nucleic Acid Atoms 1142
    Heterogen Atoms 60
    Solvent Atoms 708
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER in PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER version: in PHENIX
    data collection CBASS