X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.8
Temperature 290.0
Details 47%-49% Saturated Ammonium Sulfate, 2.5% MPD, 10mM MgSO4, 100mM MES, pH 5.8, VAPOR DIFFUSION, HANGING DROP, temperature 290K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 93.22 α = 90
b = 108.48 β = 90
c = 150.95 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2011-10-30
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.0000 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.63 50 100.0 0.063 -- -- 10.0 -- 190429 -- -3.0 29.124
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.63 1.73 99.8 0.506 -- 3.38 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.63 34.98 -- 2.35 -- 184317 8311 96.77 -- 0.1708 0.1698 0.1924 Inherited free reflections from 2HVI plus 5% randomly generated reflections beyond 1.98 resolution
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.63 1.6485 -- 267 5062 0.2473 0.266 -- 85.0
X Ray Diffraction 1.6485 1.6679 -- 278 5282 0.2354 0.2498 -- 88.0
X Ray Diffraction 1.6679 1.6883 -- 281 5334 0.2233 0.2535 -- 89.0
X Ray Diffraction 1.6883 1.7096 -- 285 5421 0.2183 0.2497 -- 91.0
X Ray Diffraction 1.7096 1.7321 -- 287 5464 0.2039 0.2441 -- 91.0
X Ray Diffraction 1.7321 1.7559 -- 296 5619 0.2013 0.2299 -- 93.0
X Ray Diffraction 1.7559 1.7809 -- 295 5609 0.1936 0.2378 -- 94.0
X Ray Diffraction 1.7809 1.8075 -- 302 5723 0.1865 0.2085 -- 95.0
X Ray Diffraction 1.8075 1.8358 -- 300 5711 0.1862 0.2202 -- 95.0
X Ray Diffraction 1.8358 1.8659 -- 301 5724 0.1866 0.2314 -- 96.0
X Ray Diffraction 1.8659 1.898 -- 303 5750 0.1835 0.2173 -- 96.0
X Ray Diffraction 1.898 1.9325 -- 309 5861 0.1777 0.2058 -- 98.0
X Ray Diffraction 1.9325 1.9697 -- 307 5839 0.1786 0.2199 -- 98.0
X Ray Diffraction 1.9697 2.0099 -- 182 6025 0.1745 0.2114 -- 98.0
X Ray Diffraction 2.0099 2.0536 -- 212 6037 0.1667 0.1802 -- 99.0
X Ray Diffraction 2.0536 2.1014 -- 231 6035 0.1657 0.1995 -- 99.0
X Ray Diffraction 2.1014 2.1539 -- 247 6018 0.1609 0.178 -- 99.0
X Ray Diffraction 2.1539 2.2121 -- 264 6056 0.1598 0.1908 -- 99.0
X Ray Diffraction 2.2121 2.2772 -- 238 6041 0.1599 0.1895 -- 99.0
X Ray Diffraction 2.2772 2.3507 -- 227 6074 0.1538 0.1947 -- 99.0
X Ray Diffraction 2.3507 2.4347 -- 250 6061 0.1607 0.1851 -- 100.0
X Ray Diffraction 2.4347 2.5322 -- 253 6089 0.1618 0.1882 -- 100.0
X Ray Diffraction 2.5322 2.6474 -- 254 6100 0.1698 0.1766 -- 100.0
X Ray Diffraction 2.6474 2.7869 -- 271 6075 0.1749 0.2031 -- 100.0
X Ray Diffraction 2.7869 2.9614 -- 284 6090 0.1857 0.2282 -- 100.0
X Ray Diffraction 2.9614 3.1899 -- 304 6096 0.1797 0.1971 -- 100.0
X Ray Diffraction 3.1899 3.5107 -- 318 6085 0.1591 0.1716 -- 100.0
X Ray Diffraction 3.5107 4.018 -- 314 6139 0.1487 0.1536 -- 100.0
X Ray Diffraction 4.018 5.0599 -- 321 6197 0.1413 0.1634 -- 100.0
X Ray Diffraction 5.0599 34.988 -- 330 6389 0.1864 0.1996 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.011
f_dihedral_angle_d 15.169
f_plane_restr 0.007
f_angle_d 1.375
f_chiral_restr 0.083
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9310
Nucleic Acid Atoms 832
Heterogen Atoms 120
Solvent Atoms 1238

Software

Software
Software Name Purpose
XSCALE data scaling
PHENIX refinement version: dev_1026
PDB_EXTRACT data extraction version: 3.11
XDS data reduction