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X-RAY DIFFRACTION
Materials and Methods page
4F2F
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 28% w/v PEG2000 MME, 0.1 M Bis-Tris, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 35.46 α = 90
    b = 37.33 β = 90
    c = 69.29 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
    Diffrn ID 2
    Data Collection Temperature 113
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Collection Date 2011-04-19
    Detector CCD
    Type NOIR-1
    Collection Date 2011-04-22
     
    Diffraction Radiation
    Monochromator osmic mirrors
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator sagitally focused Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU
    Wavelength List 1.54178
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 1.37757
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.45
    Resolution(Low) 50
    Number Reflections(All) 16959
    Number Reflections(Observed) 16813
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.035
    Redundancy 11.4
     
    High Resolution Shell Details
    Resolution(High) 1.45
    Resolution(Low) 1.48
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.363
    Mean I Over Sigma(Observed) 6.3
    Redundancy 10.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.5
    Resolution(Low) 20.645
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 15410
    Number of Reflections(Observed) 15310
    Number of Reflections(R-Free) 1567
    Percent Reflections(Observed) 99.96
    R-Factor(Observed) 0.2166
    R-Work 0.2134
    R-Free 0.243
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.0013
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.5114
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.49
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.5484
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.2561
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5484
    Shell Resolution(Low) 1.6037
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1215
    R-Factor(R-Work) 0.2082
    R-Factor(R-Free) 0.2672
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6037
    Shell Resolution(Low) 1.6679
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1219
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6679
    Shell Resolution(Low) 1.7438
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1226
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7438
    Shell Resolution(Low) 1.8357
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1242
    R-Factor(R-Work) 0.2192
    R-Factor(R-Free) 0.2425
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8357
    Shell Resolution(Low) 1.9506
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1212
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2467
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9506
    Shell Resolution(Low) 2.1011
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1237
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.2701
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1011
    Shell Resolution(Low) 2.3123
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1255
    R-Factor(R-Work) 0.22
    R-Factor(R-Free) 0.2631
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3123
    Shell Resolution(Low) 2.6463
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1256
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6463
    Shell Resolution(Low) 3.3317
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1283
    R-Factor(R-Work) 0.2236
    R-Factor(R-Free) 0.271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3317
    Shell Resolution(Low) 20.6471
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1353
    R-Factor(R-Work) 0.1971
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.045
    f_dihedral_angle_d 13.56
    f_angle_d 0.766
    f_bond_d 0.02
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 783
    Nucleic Acid Atoms 0
    Heterogen Atoms 3
    Solvent Atoms 123
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX
    data collection HKL-2000