X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 28% w/v PEG2000 MME, 0.1 M Bis-Tris, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 35.46 α = 90
b = 37.33 β = 90
c = 69.29 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 93
2 113
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD NOIR-1 -- 2011-04-22
IMAGE PLATE RIGAKU RAXIS IV++ -- 2011-04-19
Diffraction Radiation
Monochromator Protocol
osmic mirrors SINGLE WAVELENGTH
sagitally focused Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 4.2.2 1.37757 ALS 4.2.2
ROTATING ANODE RIGAKU 1.54178 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 50 99.9 0.035 -- -- 11.4 16959 16813 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.45 1.48 100.0 0.363 -- 6.3 10.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.5 20.645 -- 1.34 15410 15310 1567 99.96 -- 0.2166 0.2134 0.243 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5 1.5484 -- 124 1245 0.232 0.2561 -- 100.0
X Ray Diffraction 1.5484 1.6037 -- 146 1215 0.2082 0.2672 -- 100.0
X Ray Diffraction 1.6037 1.6679 -- 139 1219 0.1979 0.2503 -- 100.0
X Ray Diffraction 1.6679 1.7438 -- 141 1226 0.2099 0.23 -- 100.0
X Ray Diffraction 1.7438 1.8357 -- 144 1242 0.2192 0.2425 -- 100.0
X Ray Diffraction 1.8357 1.9506 -- 154 1212 0.2195 0.2467 -- 100.0
X Ray Diffraction 1.9506 2.1011 -- 155 1237 0.2234 0.2701 -- 100.0
X Ray Diffraction 2.1011 2.3123 -- 132 1255 0.22 0.2631 -- 100.0
X Ray Diffraction 2.3123 2.6463 -- 135 1256 0.2243 0.2354 -- 100.0
X Ray Diffraction 2.6463 3.3317 -- 143 1283 0.2236 0.271 -- 100.0
X Ray Diffraction 3.3317 20.6471 -- 154 1353 0.1971 0.2125 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 3.0013
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.5114
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.49
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.766
f_chiral_restr 0.045
f_bond_d 0.02
f_plane_restr 0.003
f_dihedral_angle_d 13.56
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 783
Nucleic Acid Atoms 0
Heterogen Atoms 3
Solvent Atoms 123

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
HKL-2000 data collection
PHENIX model building