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X-RAY DIFFRACTION
Materials and Methods page
4F2E
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5
    Temperature 293.0
    Details 30% w/v PEG3350, 0.1 M sodium citrate tribasic dihydrate, pH 5.0, Deoxy Big CHAP, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.21 α = 90
    b = 78.65 β = 90
    c = 23.45 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 113
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Collection Date 2011-06-25
     
    Diffraction Radiation
    Monochromator osmic mirrors
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.45
    Resolution(Low) 50
    Number Reflections(All) 16223
    Number Reflections(Observed) 16187
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.024
    Redundancy 6.6
     
    High Resolution Shell Details
    Resolution(High) 1.449
    Resolution(Low) 1.48
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.183
    Mean I Over Sigma(Observed) 8.2
    Redundancy 6.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.449
    Resolution(Low) 21.005
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 16223
    Number of Reflections(Observed) 16186
    Number of Reflections(R-Free) 1619
    Percent Reflections(Observed) 99.78
    R-Factor(Observed) 0.18
    R-Work 0.1778
    R-Free 0.1998
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.6536
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.7192
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0656
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.449
    Shell Resolution(Low) 1.4913
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1170
    R-Factor(R-Work) 0.4584
    R-Factor(R-Free) 0.4522
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4913
    Shell Resolution(Low) 1.5394
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1186
    R-Factor(R-Work) 0.3195
    R-Factor(R-Free) 0.3218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5394
    Shell Resolution(Low) 1.5944
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1179
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.2458
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5944
    Shell Resolution(Low) 1.6582
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1197
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2115
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6582
    Shell Resolution(Low) 1.7337
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1192
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7337
    Shell Resolution(Low) 1.825
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1212
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.825
    Shell Resolution(Low) 1.9393
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1200
    R-Factor(R-Work) 0.1618
    R-Factor(R-Free) 0.186
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9393
    Shell Resolution(Low) 2.0889
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1201
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.2039
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0889
    Shell Resolution(Low) 2.2989
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1226
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2989
    Shell Resolution(Low) 2.631
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1245
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.631
    Shell Resolution(Low) 3.3127
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1237
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3127
    Shell Resolution(Low) 21.0074
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1322
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.1606
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.061
    f_dihedral_angle_d 11.892
    f_angle_d 0.913
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 751
    Nucleic Acid Atoms 0
    Heterogen Atoms 3
    Solvent Atoms 192
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX
    data collection HKL-2000