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X-RAY DIFFRACTION
Materials and Methods page
4F0A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.5
    Temperature 293.0
    Details 4-10 % (w/v) PEG 400 15-25 mM Zinc acetate 100 mM Sodium acetate, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 110.07 α = 90
    b = 110.07 β = 90
    c = 82.82 γ = 90
     
    Space Group
    Space Group Name:    P 41
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2012-01-08
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.03325
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.25
    Resolution(Low) 28.64
    Number Reflections(Observed) 29898
    Percent Possible(Observed) 97.7
    Redundancy 2.3
     
    High Resolution Shell Details
    Resolution(High) 3.25
    Resolution(Low) 3.3
    Percent Possible(All) 98.7
    Mean I Over Sigma(Observed) 2.0
    R-Sym I(Observed) 0.582
    Redundancy 2.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MIRAS
    reflnsShellList 3.25
    Resolution(Low) 28.64
    Cut-off Sigma(F) 1.11
    Number of Reflections(all) 30618
    Number of Reflections(Observed) 29898
    Number of Reflections(R-Free) 1499
    Percent Reflections(Observed) 97.77
    R-Factor(Observed) 0.2051
    R-Work 0.2035
    R-Free 0.2345
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 6.1583
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.1583
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -12.3166
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2502
    Shell Resolution(Low) 3.3549
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.3058
    R-Factor(R-Free) 0.305
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3549
    Shell Resolution(Low) 3.4746
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2685
    R-Factor(R-Free) 0.3085
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4746
    Shell Resolution(Low) 3.6135
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.3442
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6135
    Shell Resolution(Low) 3.7776
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2520
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.3198
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7776
    Shell Resolution(Low) 3.9763
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.22
    R-Factor(R-Free) 0.2688
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9763
    Shell Resolution(Low) 4.2247
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2550
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2247
    Shell Resolution(Low) 4.5497
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2413
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5497
    Shell Resolution(Low) 5.0054
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0054
    Shell Resolution(Low) 5.7246
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.1927
    R-Factor(R-Free) 0.1948
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7246
    Shell Resolution(Low) 7.1935
    Number of Reflections(R-Free) 83
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1935
    Shell Resolution(Low) 28.6451
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2517
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.1918
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.267
    f_dihedral_angle_d 22.458
    f_angle_d 0.88
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3189
    Nucleic Acid Atoms 0
    Heterogen Atoms 145
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building SHARP
    data collection BLU-ICE