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X-RAY DIFFRACTION
Materials and Methods page
4EZ5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 298.0
    Details 0.1M MES pH 6.0, 12% PEG3350, 0.1M NH4NO3, EVAPORATION, temperature 298K, VAPOR DIFFUSION, HANGING DROP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 102.48 α = 90
    b = 102.48 β = 90
    c = 59.99 γ = 90
     
    Space Group
    Space Group Name:    I 4
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 1
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.7
    Resolution(Low) 20
    Number Reflections(All) 8618
    Number Reflections(Observed) 8618
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.086
    Redundancy 7.46
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7
    Resolution(Low) 19.625
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 8616
    Number of Reflections(R-Free) 408
    Percent Reflections(Observed) 99.91
    R-Factor(Observed) 0.2196
    R-Work 0.2162
    R-Free 0.287
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 93.8221
    Anisotropic B[1][1] 10.1464
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 10.1464
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -20.2929
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7005
    Shell Resolution(Low) 3.09
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.336
    R-Factor(R-Free) 0.408
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.09
    Shell Resolution(Low) 3.888
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.3367
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.888
    Shell Resolution(Low) 19.6259
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2792
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2529
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.314
    f_plane_restr 0.005
    f_chiral_restr 0.061
    f_angle_d 0.948
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2062
    Nucleic Acid Atoms 0
    Heterogen Atoms 36
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DTREK
    Data Reduction (data scaling) DTREK
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction D*trek
    data collection D*trek version: 9.9.3L