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X-RAY DIFFRACTION
Materials and Methods page
4EYW
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 148.14 α = 90
    b = 148.14 β = 90
    c = 192.07 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2006-11-24
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 0.97200
    Wavelength List 0.97200
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.88
    Resolution(Low) 45.98
    Number Reflections(Observed) 170100
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.096
    Redundancy 7.2
     
    High Resolution Shell Details
    Resolution(High) 1.88
    Resolution(Low) 1.98
    Percent Possible(All) 95.9
    R Merge I(Observed) 0.739
    Mean I Over Sigma(Observed) 2.59
    R-Sym I(Observed) 0.739
    Redundancy 4.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.885
    Resolution(Low) 45.983
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 170055
    Number of Reflections(R-Free) 8492
    Percent Reflections(Observed) 99.27
    R-Factor(Observed) 0.1739
    R-Work 0.1727
    R-Free 0.1972
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.885
    Shell Resolution(Low) 1.9065
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 4773
    R-Factor(R-Work) 0.2674
    R-Factor(R-Free) 0.2857
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9065
    Shell Resolution(Low) 1.9289
    Number of Reflections(R-Free) 263
    Number of Reflections(R-Work) 5193
    R-Factor(R-Work) 0.2363
    R-Factor(R-Free) 0.2799
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9289
    Shell Resolution(Low) 1.9524
    Number of Reflections(R-Free) 283
    Number of Reflections(R-Work) 5265
    R-Factor(R-Work) 0.2282
    R-Factor(R-Free) 0.2676
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9524
    Shell Resolution(Low) 1.9771
    Number of Reflections(R-Free) 298
    Number of Reflections(R-Work) 5344
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2577
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9771
    Shell Resolution(Low) 2.0032
    Number of Reflections(R-Free) 252
    Number of Reflections(R-Work) 5385
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0032
    Shell Resolution(Low) 2.0306
    Number of Reflections(R-Free) 269
    Number of Reflections(R-Work) 5374
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0306
    Shell Resolution(Low) 2.0596
    Number of Reflections(R-Free) 311
    Number of Reflections(R-Work) 5330
    R-Factor(R-Work) 0.1953
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0596
    Shell Resolution(Low) 2.0904
    Number of Reflections(R-Free) 278
    Number of Reflections(R-Work) 5382
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0904
    Shell Resolution(Low) 2.123
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 5362
    R-Factor(R-Work) 0.1837
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.123
    Shell Resolution(Low) 2.1578
    Number of Reflections(R-Free) 290
    Number of Reflections(R-Work) 5338
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1578
    Shell Resolution(Low) 2.195
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 5331
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.195
    Shell Resolution(Low) 2.2349
    Number of Reflections(R-Free) 295
    Number of Reflections(R-Work) 5397
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.2331
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2349
    Shell Resolution(Low) 2.2779
    Number of Reflections(R-Free) 291
    Number of Reflections(R-Work) 5376
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2779
    Shell Resolution(Low) 2.3244
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 5364
    R-Factor(R-Work) 0.1827
    R-Factor(R-Free) 0.2207
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3244
    Shell Resolution(Low) 2.375
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 5435
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.375
    Shell Resolution(Low) 2.4302
    Number of Reflections(R-Free) 279
    Number of Reflections(R-Work) 5398
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2111
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4302
    Shell Resolution(Low) 2.491
    Number of Reflections(R-Free) 281
    Number of Reflections(R-Work) 5393
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.491
    Shell Resolution(Low) 2.5583
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 5433
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2266
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5583
    Shell Resolution(Low) 2.6336
    Number of Reflections(R-Free) 302
    Number of Reflections(R-Work) 5376
    R-Factor(R-Work) 0.1755
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6336
    Shell Resolution(Low) 2.7186
    Number of Reflections(R-Free) 263
    Number of Reflections(R-Work) 5424
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7186
    Shell Resolution(Low) 2.8157
    Number of Reflections(R-Free) 258
    Number of Reflections(R-Work) 5438
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8157
    Shell Resolution(Low) 2.9285
    Number of Reflections(R-Free) 269
    Number of Reflections(R-Work) 5440
    R-Factor(R-Work) 0.1759
    R-Factor(R-Free) 0.2019
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9285
    Shell Resolution(Low) 3.0617
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 5414
    R-Factor(R-Work) 0.1807
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0617
    Shell Resolution(Low) 3.2231
    Number of Reflections(R-Free) 297
    Number of Reflections(R-Work) 5464
    R-Factor(R-Work) 0.1746
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2231
    Shell Resolution(Low) 3.425
    Number of Reflections(R-Free) 287
    Number of Reflections(R-Work) 5456
    R-Factor(R-Work) 0.1661
    R-Factor(R-Free) 0.1728
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.425
    Shell Resolution(Low) 3.6893
    Number of Reflections(R-Free) 290
    Number of Reflections(R-Work) 5468
    R-Factor(R-Work) 0.1539
    R-Factor(R-Free) 0.1822
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6893
    Shell Resolution(Low) 4.0604
    Number of Reflections(R-Free) 303
    Number of Reflections(R-Work) 5473
    R-Factor(R-Work) 0.1437
    R-Factor(R-Free) 0.1526
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0604
    Shell Resolution(Low) 4.6474
    Number of Reflections(R-Free) 286
    Number of Reflections(R-Work) 5549
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1717
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6474
    Shell Resolution(Low) 5.8534
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 5560
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.1643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8534
    Shell Resolution(Low) 45.983
    Number of Reflections(R-Free) 296
    Number of Reflections(R-Work) 5628
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.1819
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 13.674
    f_angle_d 1.033
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10031
    Nucleic Acid Atoms 0
    Heterogen Atoms 94
    Solvent Atoms 1189
     
     
  •   Software and Computing Hide
    Computing
    Data Collection beamline software
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SADABS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1032)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1032)
    model building PHASER
    data collection beamline version: software