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X-RAY DIFFRACTION
Materials and Methods page
4EYI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 291.15
    Details 15% PEG 5000MME, 0.2 M NH4SO4, 0.1M MES pH 6.5, 2.5% glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 291.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 98.85 α = 90
    b = 98.85 β = 90
    c = 194.2 γ = 120
     
    Space Group
    Space Group Name:    P 65 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-08-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.97918
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.9
    Resolution(Low) 32.36
    Number Reflections(All) 13665
    Number Reflections(Observed) 12929
    Percent Possible(Observed) 98.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.9
    Resolution(Low) 32.356
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 13665
    Number of Reflections(Observed) 12929
    Number of Reflections(R-Free) 1028
    Percent Reflections(Observed) 98.85
    R-Factor(Observed) 0.2216
    R-Work 0.2179
    R-Free 0.2637
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.8847
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.8847
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.7695
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9003
    Shell Resolution(Low) 3.0531
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1659
    R-Factor(R-Work) 0.3369
    R-Factor(R-Free) 0.3646
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0531
    Shell Resolution(Low) 3.2442
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1656
    R-Factor(R-Work) 0.2716
    R-Factor(R-Free) 0.3516
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2442
    Shell Resolution(Low) 3.4944
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1690
    R-Factor(R-Work) 0.2433
    R-Factor(R-Free) 0.3045
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4944
    Shell Resolution(Low) 3.8456
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1676
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.3144
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8456
    Shell Resolution(Low) 4.4008
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1703
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4008
    Shell Resolution(Low) 5.5401
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1711
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2242
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5401
    Shell Resolution(Low) 32.3583
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1806
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 19.982
    f_angle_d 1.14
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2946
    Nucleic Acid Atoms 326
    Heterogen Atoms 33
    Solvent Atoms 28
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building Phaser
    data collection ADSC version: Quantum