Structure of FabH and factors affecting the distribution of branched fatty acids in Micrococcus luteus.

Pereira, J.H., Goh, E.B., Keasling, J.D., Beller, H.R., Adams, P.D.

doi:10.1107/S0907444912028351

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X-RAY DIFFRACTION

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4EWP

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Crystallization

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Crystallization Experiments

Method	VAPOR DIFFUSION, SITTING DROP
pH	9
Temperature	298.0
Details	0.1 M Bis-Tris propane pH 9.0, 10% PEG 200, 18% PEG 8,000, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

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Unit Cell

Length	(Å)	Angle	(°)
a =	80.14	α =	69.82
b =	85.03	β =	71.37
c =	96.92	γ =	85.66

Space Group

Diffraction

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Diffraction Experiment

Diffrn ID	1
Data Collection Temperature	298

Diffraction Detector

Detector	CCD
Type	ADSC QUANTUM 315r
Collection Date	2010-03-10

Diffraction Radiation

Monochromator	Double crystal, Si(111)
Diffraction Protocol	SINGLE WAVELENGTH

Diffraction Source

Source	SYNCHROTRON
Type	ALS BEAMLINE 8.2.2
Wavelength List	0.9774
Site	ALS
Beamline	8.2.2

Refinement Data

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Reflection Details

Observed Criterion Sigma (F)	2.0
Observed Criterion Sigma(I)	2.0
Resolution(High)	2.2
Resolution(Low)	49.8
Percent Possible(Observed)	96.1

Refinement

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Refinement Statistics

Structure Solution Method	MOLECULAR REPLACEMENT
reflnsShellList	2.198
Resolution(Low)	49.797
Cut-off Sigma(F)	1.96
Number of Reflections(all)	111229
Number of Reflections(Observed)	111229
Number of Reflections(R-Free)	5572
Percent Reflections(Observed)	96.1
R-Factor(All)	0.1689
R-Factor(Observed)	0.1709
R-Work	0.1689
R-Free	0.2098
R-Free Selection Details	RANDOM

Temperature Factor Modeling

Anisotropic B[1][1]	-0.3381
Anisotropic B[1][2]	6.7032
Anisotropic B[1][3]	-0.7289
Anisotropic B[2][2]	-3.0285
Anisotropic B[2][3]	-4.5501
Anisotropic B[3][3]	3.3666

Resolution Shells

Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.198
Shell Resolution(Low)	2.2231
Number of Reflections(R-Free)	145
Number of Reflections(R-Work)	2695
R-Factor(R-Work)	0.2284
R-Factor(R-Free)	0.2703
Percent Reflections(Observed)	73.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.2231
Shell Resolution(Low)	2.2493
Number of Reflections(R-Free)	180
Number of Reflections(R-Work)	3154
R-Factor(R-Work)	0.2357
R-Factor(R-Free)	0.2628
Percent Reflections(Observed)	87.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.2493
Shell Resolution(Low)	2.2767
Number of Reflections(R-Free)	173
Number of Reflections(R-Work)	3227
R-Factor(R-Work)	0.2409
R-Factor(R-Free)	0.3051
Percent Reflections(Observed)	89.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.2767
Shell Resolution(Low)	2.3055
Number of Reflections(R-Free)	191
Number of Reflections(R-Work)	3351
R-Factor(R-Work)	0.2334
R-Factor(R-Free)	0.2853
Percent Reflections(Observed)	91.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.3055
Shell Resolution(Low)	2.3359
Number of Reflections(R-Free)	192
Number of Reflections(R-Work)	3358
R-Factor(R-Work)	0.2118
R-Factor(R-Free)	0.2866
Percent Reflections(Observed)	93.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.3359
Shell Resolution(Low)	2.3679
Number of Reflections(R-Free)	193
Number of Reflections(R-Work)	3499
R-Factor(R-Work)	0.2172
R-Factor(R-Free)	0.2609
Percent Reflections(Observed)	94.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.3679
Shell Resolution(Low)	2.4017
Number of Reflections(R-Free)	172
Number of Reflections(R-Work)	3434
R-Factor(R-Work)	0.2217
R-Factor(R-Free)	0.2435
Percent Reflections(Observed)	96.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.4017
Shell Resolution(Low)	2.4376
Number of Reflections(R-Free)	183
Number of Reflections(R-Work)	3564
R-Factor(R-Work)	0.2141
R-Factor(R-Free)	0.2748
Percent Reflections(Observed)	96.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.4376
Shell Resolution(Low)	2.4756
Number of Reflections(R-Free)	191
Number of Reflections(R-Work)	3518
R-Factor(R-Work)	0.2368
R-Factor(R-Free)	0.2915
Percent Reflections(Observed)	97.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.4756
Shell Resolution(Low)	2.5162
Number of Reflections(R-Free)	178
Number of Reflections(R-Work)	3584
R-Factor(R-Work)	0.2295
R-Factor(R-Free)	0.2965
Percent Reflections(Observed)	97.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.5162
Shell Resolution(Low)	2.5596
Number of Reflections(R-Free)	186
Number of Reflections(R-Work)	3554
R-Factor(R-Work)	0.2061
R-Factor(R-Free)	0.2468
Percent Reflections(Observed)	97.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.5596
Shell Resolution(Low)	2.6062
Number of Reflections(R-Free)	204
Number of Reflections(R-Work)	3582
R-Factor(R-Work)	0.2062
R-Factor(R-Free)	0.2541
Percent Reflections(Observed)	97.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.6062
Shell Resolution(Low)	2.6563
Number of Reflections(R-Free)	208
Number of Reflections(R-Work)	3509
R-Factor(R-Work)	0.1936
R-Factor(R-Free)	0.2652
Percent Reflections(Observed)	98.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.6563
Shell Resolution(Low)	2.7105
Number of Reflections(R-Free)	164
Number of Reflections(R-Work)	3611
R-Factor(R-Work)	0.1951
R-Factor(R-Free)	0.277
Percent Reflections(Observed)	98.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.7105
Shell Resolution(Low)	2.7694
Number of Reflections(R-Free)	182
Number of Reflections(R-Work)	3603
R-Factor(R-Work)	0.1835
R-Factor(R-Free)	0.2229
Percent Reflections(Observed)	98.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.7694
Shell Resolution(Low)	2.8338
Number of Reflections(R-Free)	177
Number of Reflections(R-Work)	3646
R-Factor(R-Work)	0.1745
R-Factor(R-Free)	0.2261
Percent Reflections(Observed)	98.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.8338
Shell Resolution(Low)	2.9047
Number of Reflections(R-Free)	169
Number of Reflections(R-Work)	3628
R-Factor(R-Work)	0.1701
R-Factor(R-Free)	0.2009
Percent Reflections(Observed)	98.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.9047
Shell Resolution(Low)	2.9832
Number of Reflections(R-Free)	177
Number of Reflections(R-Work)	3624
R-Factor(R-Work)	0.1786
R-Factor(R-Free)	0.2337
Percent Reflections(Observed)	98.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	2.9832
Shell Resolution(Low)	3.071
Number of Reflections(R-Free)	193
Number of Reflections(R-Work)	3596
R-Factor(R-Work)	0.1711
R-Factor(R-Free)	0.2105
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	3.071
Shell Resolution(Low)	3.1701
Number of Reflections(R-Free)	188
Number of Reflections(R-Work)	3611
R-Factor(R-Work)	0.1675
R-Factor(R-Free)	0.2018
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	3.1701
Shell Resolution(Low)	3.2834
Number of Reflections(R-Free)	182
Number of Reflections(R-Work)	3625
R-Factor(R-Work)	0.1738
R-Factor(R-Free)	0.2276
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	3.2834
Shell Resolution(Low)	3.4148
Number of Reflections(R-Free)	202
Number of Reflections(R-Work)	3592
R-Factor(R-Work)	0.161
R-Factor(R-Free)	0.2116
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	3.4148
Shell Resolution(Low)	3.5702
Number of Reflections(R-Free)	217
Number of Reflections(R-Work)	3600
R-Factor(R-Work)	0.1615
R-Factor(R-Free)	0.2067
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	3.5702
Shell Resolution(Low)	3.7584
Number of Reflections(R-Free)	197
Number of Reflections(R-Work)	3611
R-Factor(R-Work)	0.161
R-Factor(R-Free)	0.185
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	3.7584
Shell Resolution(Low)	3.9937
Number of Reflections(R-Free)	195
Number of Reflections(R-Work)	3658
R-Factor(R-Work)	0.1363
R-Factor(R-Free)	0.1778
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	3.9937
Shell Resolution(Low)	4.3019
Number of Reflections(R-Free)	175
Number of Reflections(R-Work)	3648
R-Factor(R-Work)	0.1234
R-Factor(R-Free)	0.149
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	4.3019
Shell Resolution(Low)	4.7346
Number of Reflections(R-Free)	206
Number of Reflections(R-Work)	3630
R-Factor(R-Work)	0.1156
R-Factor(R-Free)	0.1555
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	4.7346
Shell Resolution(Low)	5.4189
Number of Reflections(R-Free)	186
Number of Reflections(R-Work)	3632
R-Factor(R-Work)	0.1332
R-Factor(R-Free)	0.1605
Percent Reflections(Observed)	99.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	5.4189
Shell Resolution(Low)	6.8245
Number of Reflections(R-Free)	181
Number of Reflections(R-Work)	3660
R-Factor(R-Work)	0.1628
R-Factor(R-Free)	0.1853
Percent Reflections(Observed)	100.0
Refinement method	X-RAY DIFFRACTION
Shell Resolution(High)	6.8245
Shell Resolution(Low)	49.8096
Number of Reflections(R-Free)	185
Number of Reflections(R-Work)	3653
R-Factor(R-Work)	0.1575
R-Factor(R-Free)	0.1774
Percent Reflections(Observed)	99.0

RMS Deviations

Parameter Type	Deviation from Ideal
f_plane_restr	0.005
f_chiral_restr	0.07
f_dihedral_angle_d	14.07
f_angle_d	1.071
f_bond_d	0.007

Number of Non-Hydrogen Atoms Used in Refinement

Protein Atoms	15456
Nucleic Acid Atoms	0
Heterogen Atoms	0
Solvent Atoms	877

Software and Computing

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Computing

Data Collection	BOS
Data Reduction (intensity integration)	HKL-2000
Data Reduction (data scaling)	HKL-2000
Structure Solution	PHENIX
Structure Refinement	PHENIX (phenix.refine: dev_718)

Software

refinement	PHENIX version: (phenix.refine: dev_718)
model building	PHENIX
data collection	BOS

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