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X-RAY DIFFRACTION
Materials and Methods page
4EWP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 9
    Temperature 298.0
    Details 0.1 M Bis-Tris propane pH 9.0, 10% PEG 200, 18% PEG 8,000, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 80.14 α = 69.82
    b = 85.03 β = 71.37
    c = 96.92 γ = 85.66
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 298
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-03-10
     
    Diffraction Radiation
    Monochromator Double crystal, Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.2
    Wavelength List 0.9774
    Site ALS
    Beamline 8.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.2
    Resolution(Low) 49.8
    Percent Possible(Observed) 96.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.198
    Resolution(Low) 49.797
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 111229
    Number of Reflections(Observed) 111229
    Number of Reflections(R-Free) 5572
    Percent Reflections(Observed) 96.1
    R-Factor(All) 0.1689
    R-Factor(Observed) 0.1709
    R-Work 0.1689
    R-Free 0.2098
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.3381
    Anisotropic B[1][2] 6.7032
    Anisotropic B[1][3] -0.7289
    Anisotropic B[2][2] -3.0285
    Anisotropic B[2][3] -4.5501
    Anisotropic B[3][3] 3.3666
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.198
    Shell Resolution(Low) 2.2231
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.2284
    R-Factor(R-Free) 0.2703
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2231
    Shell Resolution(Low) 2.2493
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3154
    R-Factor(R-Work) 0.2357
    R-Factor(R-Free) 0.2628
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2493
    Shell Resolution(Low) 2.2767
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3227
    R-Factor(R-Work) 0.2409
    R-Factor(R-Free) 0.3051
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2767
    Shell Resolution(Low) 2.3055
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3351
    R-Factor(R-Work) 0.2334
    R-Factor(R-Free) 0.2853
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3055
    Shell Resolution(Low) 2.3359
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3358
    R-Factor(R-Work) 0.2118
    R-Factor(R-Free) 0.2866
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3359
    Shell Resolution(Low) 2.3679
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3499
    R-Factor(R-Work) 0.2172
    R-Factor(R-Free) 0.2609
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3679
    Shell Resolution(Low) 2.4017
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3434
    R-Factor(R-Work) 0.2217
    R-Factor(R-Free) 0.2435
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4017
    Shell Resolution(Low) 2.4376
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3564
    R-Factor(R-Work) 0.2141
    R-Factor(R-Free) 0.2748
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4376
    Shell Resolution(Low) 2.4756
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3518
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.2915
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4756
    Shell Resolution(Low) 2.5162
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3584
    R-Factor(R-Work) 0.2295
    R-Factor(R-Free) 0.2965
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5162
    Shell Resolution(Low) 2.5596
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3554
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5596
    Shell Resolution(Low) 2.6062
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3582
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.2541
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6062
    Shell Resolution(Low) 2.6563
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3509
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6563
    Shell Resolution(Low) 2.7105
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3611
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.277
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7105
    Shell Resolution(Low) 2.7694
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3603
    R-Factor(R-Work) 0.1835
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7694
    Shell Resolution(Low) 2.8338
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3646
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2261
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8338
    Shell Resolution(Low) 2.9047
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3628
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.2009
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9047
    Shell Resolution(Low) 2.9832
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3624
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9832
    Shell Resolution(Low) 3.071
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3596
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2105
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.071
    Shell Resolution(Low) 3.1701
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3611
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1701
    Shell Resolution(Low) 3.2834
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3625
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2834
    Shell Resolution(Low) 3.4148
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3592
    R-Factor(R-Work) 0.161
    R-Factor(R-Free) 0.2116
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4148
    Shell Resolution(Low) 3.5702
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 3600
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5702
    Shell Resolution(Low) 3.7584
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3611
    R-Factor(R-Work) 0.161
    R-Factor(R-Free) 0.185
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7584
    Shell Resolution(Low) 3.9937
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3658
    R-Factor(R-Work) 0.1363
    R-Factor(R-Free) 0.1778
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9937
    Shell Resolution(Low) 4.3019
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3648
    R-Factor(R-Work) 0.1234
    R-Factor(R-Free) 0.149
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3019
    Shell Resolution(Low) 4.7346
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3630
    R-Factor(R-Work) 0.1156
    R-Factor(R-Free) 0.1555
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7346
    Shell Resolution(Low) 5.4189
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3632
    R-Factor(R-Work) 0.1332
    R-Factor(R-Free) 0.1605
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4189
    Shell Resolution(Low) 6.8245
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3660
    R-Factor(R-Work) 0.1628
    R-Factor(R-Free) 0.1853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.8245
    Shell Resolution(Low) 49.8096
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3653
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.1774
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_dihedral_angle_d 14.07
    f_angle_d 1.071
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 15456
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 877
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BOS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: dev_718)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_718)
    model building PHENIX
    data collection BOS