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X-RAY DIFFRACTION
Materials and Methods page
4EU8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.2
    Temperature 298.0
    Details 0.9 M sodium citrate, 0.1 M imidazole, 25 mM 2-mercaptoethanol, and 2 mM CoA, pH 8.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.28 α = 90
    b = 109.67 β = 90
    c = 120.07 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-07-23
     
    Diffraction Radiation
    Monochromator C(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-F
    Wavelength List 0.97872
    Site APS
    Beamline 21-ID-F
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.81
    Resolution(Low) 50
    Number Reflections(All) 81762
    Number Reflections(Observed) 81672
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.083
    Redundancy 11.9
     
    High Resolution Shell Details
    Resolution(High) 1.81
    Resolution(Low) 1.84
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.482
    Mean I Over Sigma(Observed) 5.9
    R-Sym I(Observed) 0.482
    Redundancy 11.7
    Number Unique Reflections(All) 4005
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.809
    Resolution(Low) 34.69
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 81593
    Number of Reflections(R-Free) 4077
    Percent Reflections(Observed) 99.76
    R-Factor(Observed) 0.1826
    R-Work 0.1804
    R-Free 0.2256
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.8142
    Anisotropic B[1][1] 2.2692
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.5243
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.7934
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8085
    Shell Resolution(Low) 1.8298
    Number of Reflections(Observed) 2592
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2464
    R-Factor(R-Work) 0.2404
    R-Factor(R-Free) 0.2955
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8298
    Shell Resolution(Low) 1.8521
    Number of Reflections(Observed) 2786
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.2322
    R-Factor(R-Free) 0.2802
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8521
    Shell Resolution(Low) 1.8755
    Number of Reflections(Observed) 2796
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.2917
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8755
    Shell Resolution(Low) 1.9002
    Number of Reflections(Observed) 2764
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.216
    R-Factor(R-Free) 0.2988
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9002
    Shell Resolution(Low) 1.9263
    Number of Reflections(Observed) 2785
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2831
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9263
    Shell Resolution(Low) 1.9538
    Number of Reflections(Observed) 2798
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9538
    Shell Resolution(Low) 1.9829
    Number of Reflections(Observed) 2793
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.266
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9829
    Shell Resolution(Low) 2.0139
    Number of Reflections(Observed) 2780
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.2746
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0139
    Shell Resolution(Low) 2.0469
    Number of Reflections(Observed) 2801
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0469
    Shell Resolution(Low) 2.0822
    Number of Reflections(Observed) 2771
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.1975
    R-Factor(R-Free) 0.2744
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0822
    Shell Resolution(Low) 2.1201
    Number of Reflections(Observed) 2802
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.1913
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1201
    Shell Resolution(Low) 2.1608
    Number of Reflections(Observed) 2786
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1608
    Shell Resolution(Low) 2.2049
    Number of Reflections(Observed) 2793
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2606
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2049
    Shell Resolution(Low) 2.2529
    Number of Reflections(Observed) 2835
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2529
    Shell Resolution(Low) 2.3053
    Number of Reflections(Observed) 2782
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3053
    Shell Resolution(Low) 2.3629
    Number of Reflections(Observed) 2794
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.2394
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3629
    Shell Resolution(Low) 2.4268
    Number of Reflections(Observed) 2829
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.2253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4268
    Shell Resolution(Low) 2.4982
    Number of Reflections(Observed) 2829
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4982
    Shell Resolution(Low) 2.5788
    Number of Reflections(Observed) 2799
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5788
    Shell Resolution(Low) 2.6709
    Number of Reflections(Observed) 2834
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.2238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6709
    Shell Resolution(Low) 2.7778
    Number of Reflections(Observed) 2799
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2277
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7778
    Shell Resolution(Low) 2.9042
    Number of Reflections(Observed) 2826
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.224
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9042
    Shell Resolution(Low) 3.0572
    Number of Reflections(Observed) 2864
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1899
    R-Factor(R-Free) 0.2565
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0572
    Shell Resolution(Low) 3.2486
    Number of Reflections(Observed) 2813
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2486
    Shell Resolution(Low) 3.4992
    Number of Reflections(Observed) 2839
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.1899
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4992
    Shell Resolution(Low) 3.851
    Number of Reflections(Observed) 2861
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.1606
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.851
    Shell Resolution(Low) 4.4073
    Number of Reflections(Observed) 2892
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.1887
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4073
    Shell Resolution(Low) 5.549
    Number of Reflections(Observed) 2910
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.1547
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.549
    Shell Resolution(Low) 34.696
    Number of Reflections(Observed) 3040
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2888
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.08
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_angle_d 1.111
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7682
    Nucleic Acid Atoms 0
    Heterogen Atoms 100
    Solvent Atoms 689
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL