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X-RAY DIFFRACTION
Materials and Methods page
4EU6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.2
    Temperature 298.0
    Details 0.9 M sodium citrate, 0.1 M imidazole, 25 mM 2-mercaptoethanol, and 2 mM acetyl-CoA, pH 8.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.17 α = 90
    b = 110.41 β = 90
    c = 119.82 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-07-23
     
    Diffraction Radiation
    Monochromator C(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-F
    Wavelength List 0.97872
    Site APS
    Beamline 21-ID-F
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.99
    Resolution(Low) 50
    Number Reflections(All) 61848
    Number Reflections(Observed) 61848
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.11
    Redundancy 12.7
     
    High Resolution Shell Details
    Resolution(High) 1.99
    Resolution(Low) 2.02
    Percent Possible(All) 99.1
    R Merge I(Observed) 0.53
    Mean I Over Sigma(Observed) 7.2
    R-Sym I(Observed) 0.53
    Redundancy 12.1
    Number Unique Reflections(All) 3022
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.988
    Resolution(Low) 34.745
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 61777
    Number of Reflections(R-Free) 3092
    Percent Reflections(Observed) 99.6
    R-Factor(Observed) 0.1666
    R-Work 0.1644
    R-Free 0.2085
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 22.8315
    Anisotropic B[1][1] -1.1168
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.5971
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.4803
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9878
    Shell Resolution(Low) 2.0189
    Number of Reflections(Observed) 2690
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2549
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.2431
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0189
    Shell Resolution(Low) 2.052
    Number of Reflections(Observed) 2754
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1719
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.052
    Shell Resolution(Low) 2.0873
    Number of Reflections(Observed) 2755
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1755
    R-Factor(R-Free) 0.2218
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0873
    Shell Resolution(Low) 2.1253
    Number of Reflections(Observed) 2776
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.2477
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1253
    Shell Resolution(Low) 2.1662
    Number of Reflections(Observed) 2778
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1716
    R-Factor(R-Free) 0.2346
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1662
    Shell Resolution(Low) 2.2104
    Number of Reflections(Observed) 2738
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2312
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2104
    Shell Resolution(Low) 2.2584
    Number of Reflections(Observed) 2810
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2584
    Shell Resolution(Low) 2.3109
    Number of Reflections(Observed) 2756
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.2364
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3109
    Shell Resolution(Low) 2.3687
    Number of Reflections(Observed) 2783
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3687
    Shell Resolution(Low) 2.4328
    Number of Reflections(Observed) 2776
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4328
    Shell Resolution(Low) 2.5043
    Number of Reflections(Observed) 2794
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.1911
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5043
    Shell Resolution(Low) 2.5851
    Number of Reflections(Observed) 2808
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.2366
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5851
    Shell Resolution(Low) 2.6775
    Number of Reflections(Observed) 2792
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.2288
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6775
    Shell Resolution(Low) 2.7847
    Number of Reflections(Observed) 2804
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1837
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7847
    Shell Resolution(Low) 2.9113
    Number of Reflections(Observed) 2827
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9113
    Shell Resolution(Low) 3.0647
    Number of Reflections(Observed) 2829
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1792
    R-Factor(R-Free) 0.2192
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0647
    Shell Resolution(Low) 3.2566
    Number of Reflections(Observed) 2819
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2566
    Shell Resolution(Low) 3.5078
    Number of Reflections(Observed) 2825
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1605
    R-Factor(R-Free) 0.1943
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5078
    Shell Resolution(Low) 3.8604
    Number of Reflections(Observed) 2839
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1491
    R-Factor(R-Free) 0.209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8604
    Shell Resolution(Low) 4.4181
    Number of Reflections(Observed) 2892
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.1443
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4181
    Shell Resolution(Low) 5.5626
    Number of Reflections(Observed) 2894
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.1819
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5626
    Shell Resolution(Low) 34.7502
    Number of Reflections(Observed) 3038
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2888
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.423
    f_plane_restr 0.005
    f_chiral_restr 0.069
    f_angle_d 1.047
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7767
    Nucleic Acid Atoms 0
    Heterogen Atoms 107
    Solvent Atoms 595
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL