X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.8
Temperature 293.0
Details 0.1M Na/K phosphate pH5.8, 6% PEG 3000, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 132.49 α = 90
b = 132.49 β = 90
c = 145.68 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2011-06-20
Diffraction Radiation
Monochromator Protocol
SAGITTALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97939 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 50 99.8 -- -- -- -- -- 33268 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.9 3.0 100.0 0.748 0.748 5.03 11.0 3258

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.9 39.165 -- 0.0 31417 31417 1914 94.33 0.2469 0.2469 0.2445 0.2826 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8975 2.9699 -- 122 1784 0.3298 0.3762 -- 82.0
X Ray Diffraction 2.9699 3.0502 -- 127 1961 0.317 0.3978 -- 89.0
X Ray Diffraction 3.0502 3.1399 -- 132 1979 0.3252 0.3708 -- 89.0
X Ray Diffraction 3.1399 3.2412 -- 131 2000 0.2973 0.3764 -- 91.0
X Ray Diffraction 3.2412 3.357 -- 137 2093 0.2931 0.3738 -- 95.0
X Ray Diffraction 3.357 3.4913 -- 135 2105 0.2682 0.2835 -- 95.0
X Ray Diffraction 3.4913 3.6501 -- 136 2144 0.2452 0.3321 -- 96.0
X Ray Diffraction 3.6501 3.8424 -- 127 2122 0.2227 0.2678 -- 96.0
X Ray Diffraction 3.8424 4.0829 -- 139 2140 0.2159 0.2823 -- 96.0
X Ray Diffraction 4.0829 4.3977 -- 143 2177 0.202 0.2062 -- 97.0
X Ray Diffraction 4.3977 4.8395 -- 140 2187 0.1951 0.2623 -- 98.0
X Ray Diffraction 4.8395 5.5382 -- 148 2224 0.2408 0.2984 -- 98.0
X Ray Diffraction 5.5382 6.9711 -- 142 2270 0.2665 0.2741 -- 99.0
X Ray Diffraction 6.9711 39.1686 -- 155 2317 0.2424 0.2455 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 82.2457
Anisotropic B[1][1] -11.0281
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -11.0281
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 22.0563
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.091
f_dihedral_angle_d 19.104
f_angle_d 1.367
f_bond_d 0.011
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9074
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.6.2_432) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.6.2_432) refinement
Phaser model building
HKL-2000 data collection