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X-RAY DIFFRACTION
Materials and Methods page
4ERN
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.55
    Temperature 298.0
    Details 0.1 M sodium acetate, pH 5.55, 0.2 M ammonium acetate, 27% PEG 3350, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 38.26 α = 90
    b = 73.65 β = 90
    c = 84.3 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details VariMax HF
    Collection Date 2011-02-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.8
    Resolution(Low) 18.55
    Number Reflections(All) 22258
    Number Reflections(Observed) 22258
    Percent Possible(Observed) 98.2
    B(Isotropic) From Wilson Plot 30.207
    Redundancy 4.7
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.9
    Percent Possible(All) 97.2
    R Merge I(Observed) 0.488
    Mean I Over Sigma(Observed) 1.6
    R-Sym I(Observed) 0.488
    Redundancy 4.5
    Number Unique Reflections(All) 3171
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 18.553
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 22299
    Number of Reflections(Observed) 22258
    Number of Reflections(R-Free) 1134
    Percent Reflections(Observed) 97.84
    R-Factor(Observed) 0.2028
    R-Work 0.201
    R-Free 0.2377
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Anisotropic
    Mean Isotropic B Value 42.702
    Anisotropic B[1][1] -0.4851
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0196
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.4655
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8001
    Shell Resolution(Low) 1.8819
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2547
    R-Factor(R-Work) 0.3461
    R-Factor(R-Free) 0.3862
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8819
    Shell Resolution(Low) 1.981
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.2548
    R-Factor(R-Free) 0.3272
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.981
    Shell Resolution(Low) 2.105
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.2048
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.105
    Shell Resolution(Low) 2.2672
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2672
    Shell Resolution(Low) 2.4949
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2064
    R-Factor(R-Free) 0.225
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4949
    Shell Resolution(Low) 2.8548
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.2148
    R-Factor(R-Free) 0.2921
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8548
    Shell Resolution(Low) 3.5925
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.2562
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5925
    Shell Resolution(Low) 18.5539
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.1792
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.77
    f_plane_restr 0.006
    f_chiral_restr 0.103
    f_angle_d 1.343
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1850
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 86
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    density modification DM version: 6.2
    molecular replacement Phaser version: 2.3.0
    data reduction SCALA version: 3.3.20
    data collection Mosflm version: 3.3.20