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X-RAY DIFFRACTION
Materials and Methods page
4EOG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 298.0
    Details 0.1 M MES, 0.01 M Zinc sulfate, 6 % PEG MME 550, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.8
    Temperature 298.0
    Details 0.1 M MES, 0.01 M Zinc sulfate, 6 % PEG MME 550, pH 5.8, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 51.82 α = 90
    b = 179.53 β = 90
    c = 110.59 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2011-01-01
    Detector IMAGE PLATE
    Type RIGAKU
    Collection Date 2010-12-25
     
    Diffraction Radiation
    Monochromator wiggler
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL26B2
    Wavelength List 0.9896
    Site SPRING-8
    Beamline BL26B2
    Source ROTATING ANODE
    Type RIGAKU
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 24116
    Number Reflections(Observed) 22968
    Percent Possible(Observed) 99.0
    B(Isotropic) From Wilson Plot 12.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.3
    Resolution(Low) 47.08
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 23435
    Number of Reflections(Observed) 22391
    Number of Reflections(R-Free) 2223
    Percent Reflections(Observed) 95.6
    R-Factor(Observed) 0.227
    R-Work 0.227
    R-Free 0.25
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 44.0
    Anisotropic B[1][1] 0.4
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -8.75
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 8.34
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.44
    Number of Reflections(R-Free) 339
    Number of Reflections(R-Work) 2979
    R-Factor(R-Work) 0.391
    R-Factor(R-Free) 0.384
    R-Free Error 0.021
    Percent Reflections(Observed) 86.3
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.84
    c_scbond_it 1.88
    c_mcangle_it 2.17
    c_mcbond_it 1.27
    c_improper_angle_d 0.84
    c_bond_d 0.007
    c_angle_deg 1.3
    c_dihedral_angle_d 22.7
     
    Coordinate Error
    Luzzati ESD(Observed) 0.33
    Luzzati Sigma A(Observed) 0.58
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.35
    Luzzati Sigma A(R-Free Set) 0.57
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3852
    Nucleic Acid Atoms 0
    Heterogen Atoms 8
    Solvent Atoms 71
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement CNS 1.3
     
    Software
    refinement CNS version: 1.3
    model building SHELXS
    data collection HKL-2000