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X-RAY DIFFRACTION
Materials and Methods page
4ELV
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.4
    Temperature 291.0
    Details 50 mM Tris HCl pH=8.4, 0.2 M NH4Cl, 10 mM CaCl2, 34% PEG 4000, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 109.21 α = 90
    b = 109.21 β = 90
    c = 91.05 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Details Dynamically bendable mirror, LN2 cooled fixed-exit, Si(111) monochromator
    Collection Date 2010-08-13
     
    Diffraction Radiation
    Monochromator LN2 cooled fixed-exit, Si(111) monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 1.00
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.89
    Resolution(Low) 50
    Number Reflections(All) 50305
    Number Reflections(Observed) 50305
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.118
     
    High Resolution Shell Details
    Resolution(High) 1.89
    Resolution(Low) 2.0
    Percent Possible(All) 95.6
    R Merge I(Observed) 1.182
    Mean I Over Sigma(Observed) 1.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 47.291
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 49722
    Number of Reflections(Observed) 49722
    Number of Reflections(R-Free) 2491
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.1785
    R-Work 0.1765
    R-Free 0.2157
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Isotropic Thermal Model isotropic and tls
    Anisotropic B[1][1] 5.1587
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.1587
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.1226
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9366
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2918
    R-Factor(R-Free) 0.3147
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9366
    Shell Resolution(Low) 1.9761
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2523
    R-Factor(R-Free) 0.2869
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9761
    Shell Resolution(Low) 2.0191
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2421
    R-Factor(R-Free) 0.3034
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0191
    Shell Resolution(Low) 2.066
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.2303
    R-Factor(R-Free) 0.2411
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.066
    Shell Resolution(Low) 2.1177
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2428
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1177
    Shell Resolution(Low) 2.1749
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2056
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1749
    Shell Resolution(Low) 2.2389
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2475
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2389
    Shell Resolution(Low) 2.3112
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2593
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3112
    Shell Resolution(Low) 2.3938
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3938
    Shell Resolution(Low) 2.4897
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1735
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4897
    Shell Resolution(Low) 2.603
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.603
    Shell Resolution(Low) 2.7402
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1736
    R-Factor(R-Free) 0.2299
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7402
    Shell Resolution(Low) 2.9118
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1869
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9118
    Shell Resolution(Low) 3.1366
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2613
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1366
    Shell Resolution(Low) 3.4522
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1624
    R-Factor(R-Free) 0.1881
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4522
    Shell Resolution(Low) 3.9515
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.1787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9515
    Shell Resolution(Low) 4.9776
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.1811
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9776
    Shell Resolution(Low) 47.3052
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2778
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.1915
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_dihedral_angle_d 16.929
    f_angle_d 1.172
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4286
    Nucleic Acid Atoms 520
    Heterogen Atoms 77
    Solvent Atoms 323
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHENIX (phenix.refine: dev_1009)
    Structure Refinement PHENIX (phenix.refine: dev_1009)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1009)
    model building PHENIX version: (phenix.refine: dev_1009)
    data collection XDS