X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.8
Temperature 298.0
Details 16-22% PEG 3350, 0.2M CaCl2, 0.1M MES, +/- 3% glycerol , pH 5.8, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 68.35 α = 90
b = 136.03 β = 90
c = 168.36 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2011-08-15
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CAMD BEAMLINE GCPCC 1.38 CAMD GCPCC

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 43.8 98.5 0.058 -- -- 4.4 -- 90525 -- -- 21.5

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.103 43.784 -- 1.34 -- 90400 1994 98.35 -- 0.1948 0.1935 0.2519 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1034 2.156 -- 135 5992 0.2187 0.272 -- 95.0
X Ray Diffraction 2.156 2.2143 -- 140 6256 0.2266 0.3373 -- 98.0
X Ray Diffraction 2.2143 2.2795 -- 136 6057 0.2659 0.369 -- 95.0
X Ray Diffraction 2.2795 2.3531 -- 142 6239 0.2267 0.317 -- 98.0
X Ray Diffraction 2.3531 2.4371 -- 140 6262 0.2322 0.3556 -- 98.0
X Ray Diffraction 2.4371 2.5347 -- 142 6245 0.2193 0.298 -- 99.0
X Ray Diffraction 2.5347 2.6501 -- 141 6262 0.2177 0.3033 -- 99.0
X Ray Diffraction 2.6501 2.7898 -- 142 6306 0.2064 0.2802 -- 99.0
X Ray Diffraction 2.7898 2.9645 -- 144 6381 0.1988 0.2601 -- 99.0
X Ray Diffraction 2.9645 3.1933 -- 144 6367 0.1966 0.2635 -- 100.0
X Ray Diffraction 3.1933 3.5146 -- 145 6419 0.2014 0.2521 -- 100.0
X Ray Diffraction 3.5146 4.0228 -- 146 6452 0.1808 0.2178 -- 99.0
X Ray Diffraction 4.0228 5.0671 -- 145 6474 0.136 0.1708 -- 99.0
X Ray Diffraction 5.0671 43.7939 -- 152 6694 0.191 0.2295 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 9.2144
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.8737
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -8.3407
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.07
f_dihedral_angle_d 16.737
f_angle_d 1.106
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11034
Nucleic Acid Atoms 0
Heterogen Atoms 349
Solvent Atoms 1280

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement