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X-RAY DIFFRACTION
Materials and Methods page
4ELG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.8
    Temperature 298.0
    Details 16-22% PEG 3350, 0.2M CaCl2, 0.1M MES, +/- 3% glycerol , pH 5.8, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.15 α = 90
    b = 135.65 β = 90
    c = 168.32 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2011-08-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CAMD BEAMLINE GCPCC
    Wavelength List 1.38
    Site CAMD
    Beamline GCPCC
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.1
    Resolution(Low) 48
    Number Reflections(Observed) 87128
    Percent Possible(Observed) 95.5
    R Merge I(Observed) 0.132
    B(Isotropic) From Wilson Plot 20.9
    Redundancy 4.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.101
    Resolution(Low) 48.0
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 86863
    Number of Reflections(R-Free) 3842
    Percent Reflections(Observed) 95.39
    R-Factor(Observed) 0.1949
    R-Work 0.1935
    R-Free 0.2561
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.749
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.1969
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.946
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1014
    Shell Resolution(Low) 2.128
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 5049
    R-Factor(R-Work) 0.2824
    R-Factor(R-Free) 0.38
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.128
    Shell Resolution(Low) 2.156
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 5786
    R-Factor(R-Work) 0.3024
    R-Factor(R-Free) 0.402
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.156
    Shell Resolution(Low) 2.1856
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 5824
    R-Factor(R-Work) 0.2661
    R-Factor(R-Free) 0.3824
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1856
    Shell Resolution(Low) 2.2168
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 5749
    R-Factor(R-Work) 0.2506
    R-Factor(R-Free) 0.3153
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2168
    Shell Resolution(Low) 2.2499
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 5841
    R-Factor(R-Work) 0.2281
    R-Factor(R-Free) 0.3024
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2499
    Shell Resolution(Low) 2.285
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5994
    R-Factor(R-Work) 0.2412
    R-Factor(R-Free) 0.3097
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.285
    Shell Resolution(Low) 2.3225
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6020
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.3
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3225
    Shell Resolution(Low) 2.3625
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6046
    R-Factor(R-Work) 0.2135
    R-Factor(R-Free) 0.3175
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3625
    Shell Resolution(Low) 2.4055
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6107
    R-Factor(R-Work) 0.2148
    R-Factor(R-Free) 0.3062
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4055
    Shell Resolution(Low) 2.4518
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6087
    R-Factor(R-Work) 0.2165
    R-Factor(R-Free) 0.2901
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4518
    Shell Resolution(Low) 2.5018
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6097
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.3275
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5018
    Shell Resolution(Low) 2.5562
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6140
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.3095
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5562
    Shell Resolution(Low) 2.6157
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6140
    R-Factor(R-Work) 0.208
    R-Factor(R-Free) 0.2727
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6157
    Shell Resolution(Low) 2.6811
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6127
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.2802
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6811
    Shell Resolution(Low) 2.7535
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6294
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.3405
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7535
    Shell Resolution(Low) 2.8346
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 6282
    R-Factor(R-Work) 0.2063
    R-Factor(R-Free) 0.2818
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8346
    Shell Resolution(Low) 2.926
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6238
    R-Factor(R-Work) 0.1978
    R-Factor(R-Free) 0.2689
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.926
    Shell Resolution(Low) 3.0306
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6239
    R-Factor(R-Work) 0.2033
    R-Factor(R-Free) 0.3121
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0306
    Shell Resolution(Low) 3.1519
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6299
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.244
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1519
    Shell Resolution(Low) 3.2953
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 6185
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2558
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2953
    Shell Resolution(Low) 3.469
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6244
    R-Factor(R-Work) 0.1973
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.469
    Shell Resolution(Low) 3.6863
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6246
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.2576
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6863
    Shell Resolution(Low) 3.9708
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6226
    R-Factor(R-Work) 0.1721
    R-Factor(R-Free) 0.2311
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9708
    Shell Resolution(Low) 4.3702
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6212
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.2289
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3702
    Shell Resolution(Low) 5.002
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6151
    R-Factor(R-Work) 0.1242
    R-Factor(R-Free) 0.1553
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.002
    Shell Resolution(Low) 6.2997
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6142
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.1917
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2997
    Shell Resolution(Low) 48.0878
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5899
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.2374
    Percent Reflections(Observed) 93.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 17.544
    f_angle_d 1.124
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11034
    Nucleic Acid Atoms 0
    Heterogen Atoms 386
    Solvent Atoms 1258
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)