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X-RAY DIFFRACTION
Materials and Methods page
4ELF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.8
    Temperature 298.0
    Details 16-22% PEG 3350, 0.2M CaCl2, 0.1M MES, +/- 3% glycerol , pH 5.8, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.27 α = 90
    b = 136.12 β = 90
    c = 168.46 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details Osmic Blue multilayer optics
    Collection Date 2010-11-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.3
    Resolution(Low) 37
    Number Reflections(Observed) 67586
    Percent Possible(Observed) 95.8
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 25.1
    Redundancy 2.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 31.552
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 67478
    Number of Reflections(R-Free) 3412
    Percent Reflections(Observed) 95.65
    R-Factor(Observed) 0.2313
    R-Work 0.2282
    R-Free 0.2898
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 9.9107
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.1314
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.7793
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3329
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.3593
    R-Factor(R-Free) 0.4796
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3329
    Shell Resolution(Low) 2.3677
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.3306
    R-Factor(R-Free) 0.4425
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3677
    Shell Resolution(Low) 2.4047
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.3343
    R-Factor(R-Free) 0.4078
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4047
    Shell Resolution(Low) 2.4441
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.3544
    R-Factor(R-Free) 0.3962
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4441
    Shell Resolution(Low) 2.4862
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2527
    R-Factor(R-Work) 0.3287
    R-Factor(R-Free) 0.4233
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4862
    Shell Resolution(Low) 2.5314
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.3279
    R-Factor(R-Free) 0.4271
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5314
    Shell Resolution(Low) 2.58
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.3016
    R-Factor(R-Free) 0.3533
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.58
    Shell Resolution(Low) 2.6327
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.3057
    R-Factor(R-Free) 0.4121
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6327
    Shell Resolution(Low) 2.6899
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2862
    R-Factor(R-Free) 0.3993
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6899
    Shell Resolution(Low) 2.7524
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.2637
    R-Factor(R-Free) 0.3551
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7524
    Shell Resolution(Low) 2.8212
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.2606
    R-Factor(R-Free) 0.3614
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8212
    Shell Resolution(Low) 2.8975
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2413
    R-Factor(R-Free) 0.322
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8975
    Shell Resolution(Low) 2.9827
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.2484
    R-Factor(R-Free) 0.3087
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9827
    Shell Resolution(Low) 3.0789
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.2316
    R-Factor(R-Free) 0.3048
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0789
    Shell Resolution(Low) 3.1888
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.2321
    R-Factor(R-Free) 0.3181
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1888
    Shell Resolution(Low) 3.3163
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.2327
    R-Factor(R-Free) 0.3069
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3163
    Shell Resolution(Low) 3.4671
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.231
    R-Factor(R-Free) 0.2804
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4671
    Shell Resolution(Low) 3.6496
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.235
    R-Factor(R-Free) 0.2836
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6496
    Shell Resolution(Low) 3.8779
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8779
    Shell Resolution(Low) 4.1767
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1767
    Shell Resolution(Low) 4.5959
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2789
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1969
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5959
    Shell Resolution(Low) 5.2583
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2796
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2583
    Shell Resolution(Low) 6.6148
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.2164
    R-Factor(R-Free) 0.2679
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6148
    Shell Resolution(Low) 31.5552
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2093
    R-Factor(R-Free) 0.2413
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.073
    f_dihedral_angle_d 19.883
    f_angle_d 1.197
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11034
    Nucleic Acid Atoms 0
    Heterogen Atoms 328
    Solvent Atoms 947
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) d*TREK
    Data Reduction (data scaling) SCALA
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    data collection CrystalClear