POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4ELB
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.8
    Temperature 298.0
    Details 16-22% PEG 3350, 0.2M CaCl2, 0.1M MES, +/- 3% glycerol, pH 5.8, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.87 α = 90
    b = 135.44 β = 90
    c = 168.19 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type Bruker Platinum 135
    Collection Date 2010-11-30
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type BRUKER AXS MICROSTAR
    Wavelength List 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(Observed) 48511
    Percent Possible(Observed) 100.0
    B(Isotropic) From Wilson Plot 24.0
    Redundancy 11.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 47.94
    Cut-off Sigma(F) 1.49
    Number of Reflections(Observed) 48426
    Number of Reflections(R-Free) 2459
    Percent Reflections(Observed) 99.82
    R-Factor(Observed) 0.2469
    R-Work 0.2435
    R-Free 0.3094
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.5331
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.2709
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.804
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.65
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2491
    R-Factor(R-Work) 0.3287
    R-Factor(R-Free) 0.3794
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.65
    Shell Resolution(Low) 2.7041
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.3152
    R-Factor(R-Free) 0.4058
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7041
    Shell Resolution(Low) 2.7629
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2488
    R-Factor(R-Work) 0.2888
    R-Factor(R-Free) 0.4264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7629
    Shell Resolution(Low) 2.8272
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2935
    R-Factor(R-Free) 0.361
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8272
    Shell Resolution(Low) 2.8979
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2502
    R-Factor(R-Work) 0.2616
    R-Factor(R-Free) 0.3904
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8979
    Shell Resolution(Low) 2.9762
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.2733
    R-Factor(R-Free) 0.3401
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9762
    Shell Resolution(Low) 3.0638
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2527
    R-Factor(R-Work) 0.2522
    R-Factor(R-Free) 0.3534
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0638
    Shell Resolution(Low) 3.1626
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.2563
    R-Factor(R-Free) 0.3551
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1626
    Shell Resolution(Low) 3.2756
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2547
    R-Factor(R-Work) 0.238
    R-Factor(R-Free) 0.3463
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2756
    Shell Resolution(Low) 3.4068
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2531
    R-Factor(R-Work) 0.243
    R-Factor(R-Free) 0.2882
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4068
    Shell Resolution(Low) 3.5618
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2579
    R-Factor(R-Free) 0.3285
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5618
    Shell Resolution(Low) 3.7495
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.2437
    R-Factor(R-Free) 0.3308
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7495
    Shell Resolution(Low) 3.9843
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.3067
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9843
    Shell Resolution(Low) 4.2917
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2536
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2713
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2917
    Shell Resolution(Low) 4.7233
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.2389
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7233
    Shell Resolution(Low) 5.4059
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4059
    Shell Resolution(Low) 6.8078
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.2638
    R-Factor(R-Free) 0.2926
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.8078
    Shell Resolution(Low) 47.9485
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.2769
    R-Factor(R-Free) 0.2822
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.066
    f_dihedral_angle_d 19.904
    f_angle_d 1.078
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11028
    Nucleic Acid Atoms 0
    Heterogen Atoms 406
    Solvent Atoms 620
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)